-
公开(公告)号：US20090058441A1
公开(公告)日：2009-03-05
申请号：US11995279
申请日：2005-08-09
IPC分类号： G01R31/02
CPC分类号： G01R1/06727 , G01R1/06733 , G01R1/06755
摘要： A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electrode of a device under test, the main portion being made of a tenacity material. The main portion includes a conductive material extending from the base end to the tip end and at least part of which is buried within the tenacity material, and the tenacity material has higher resiliency than that of the conductive material while the conductive material has higher conductivity than that of the tenacity material. As a result, disorder of a signal provided via the probe is decreased without losing elastic deformation.
摘要翻译： 用于电测试的探针包括板形主要部分，其具有要附接到支撑板的基端和与基端相对的尖端，以及设置在主要部分的尖端处并具有探针的探针尖端部分 尖端接触被测器件的电极，主要部分由韧性材料制成。 主要部分包括从基端延伸到末端的导电材料，其至少一部分被埋在韧性材料内，并且韧性材料具有比导电材料更高的弹性，而导电材料具有比 坚韧的材料。 结果，通过探针提供的信号的紊乱减小而不损失弹性变形。
-
公开(公告)号：US07629807B2
公开(公告)日：2009-12-08
申请号：US11995279
申请日：2005-08-09
IPC分类号： G01R31/02
CPC分类号： G01R1/06727 , G01R1/06733 , G01R1/06755
摘要： A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electrode of a device under test, the main portion being made of a tenacity material. The main portion includes a conductive material extending from the base end to the tip end and at least part of which is buried within the tenacity material, and the tenacity material has higher resiliency than that of the conductive material while the conductive material has higher conductivity than that of the tenacity material. As a result, disorder of a signal provided via the probe is decreased without losing elastic deformation.
摘要翻译： 用于电测试的探针包括板形主要部分，其具有要附接到支撑板的基端和与基端相对的尖端，以及设置在主要部分的尖端处并具有探针的探针尖端部分 尖端接触被测器件的电极，主要部分由韧性材料制成。 主要部分包括从基端延伸到末端的导电材料，其至少一部分被埋在韧性材料内，并且韧性材料具有比导电材料更高的弹性，而导电材料具有比 坚韧的材料。 结果，通过探针提供的信号的紊乱减小而不损失弹性变形。
-
公开(公告)号：US20100213956A1
公开(公告)日：2010-08-26
申请号：US12096168
申请日：2006-01-25
申请人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
发明人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
CPC分类号： G01R1/06733 , G01R1/06727 , G01R1/06761 , G01R3/00
摘要： A probe for current test comprising: a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board; a solder layer formed on at least one side face of said connection portion; and a guide portion formed on the connection portion, penetrating the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face, and when the solder layer is melted, capable of guiding a portion thereof to the other side face.
摘要翻译： 一种用于当前测试的探针，包括：探针体，其具有端面变成与探针板的连接面的板状连接部; 形成在所述连接部的至少一个侧面上的焊料层; 以及引导部，形成在所述连接部上，从形成于所述另一侧面的所述焊接层的一个侧面沿着厚度方向贯通所述连接部，并且当所述焊料层熔融时，能够将其一部分引导到 另一面
-
4.发明授权Current test probe having a solder guide portion, and related probe assembly and production method 有权目前具有焊料引导部分的测试探针，以及相关的探头组件及其制造方法公开(公告)号：US07888958B2
公开(公告)日：2011-02-15
申请号：US12096168
申请日：2006-01-25
申请人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
发明人： Akira Souma , Yoshikazu Urushiyama , Masahisa Tazawa , Tomoya Sato , Hideki Hirakawa , Takayuki Hayashizaki
IPC分类号： G01R31/00
CPC分类号： G01R1/06733 , G01R1/06727 , G01R1/06761 , G01R3/00
摘要： A probe for current test is provided. The probe includes a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board, a solder layer formed on at least one side face of said connection portion, and a guide portion formed on the connection portion. The guide portion penetrates the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face. When the solder layer is melted, the guide portion guides a portion of the melted solder to the other side face.
摘要翻译： 提供了目前测试的探头。 探针包括探针体，其具有端面成为探针板的连接面的板状连接部，形成在所述连接部的至少一个侧面上的焊料层和形成在连接部上的引导部。 引导部分从其一侧面沿其厚度方向穿透连接部分，其中焊料层形成于另一侧面。 当焊料层熔化时，引导部分将熔化的焊料的一部分引导到另一侧面。
-
公开(公告)号：US5033184A
公开(公告)日：1991-07-23
申请号：US533426
申请日：1990-06-05
申请人： Takahiko Tandai , Masahisa Tazawa
发明人： Takahiko Tandai , Masahisa Tazawa
CPC分类号： G11B5/2651 , G11B5/105 , G11B5/1272 , G11B5/1871 , Y10T29/4903
摘要： A pair of half core blocks, one of which is provided with a groove for providing a prescribed gap depth in a magnetic head, are bonded together to produce a ring core. The ring core is inserted into a slot formed in a top of a magnetic slider and secured in position which provides a precise flush relation between a base end of a half core provided with a groove and the top of the slider. The slider is ground from its bottom to expose the end of the ring core inserted into the slot to produce a head assembly. One side of the ring core portrudes from the slider in the head assembly. When one or more of the head assemblies are mounted on a base block, the protruding side is maintained in contact with a reference upstanding plane provided by a jig for definite positioning of the head assemblies so that gaps in the respective ring cores extends exactly in a running direction of a magnetic tape, thereby preventing azimuth loss.
摘要翻译： 一对半芯块，其中一个在磁头中设置有用于提供规定间隙深度的凹槽，其结合在一起以产生环形芯。 将环形芯插入到形成在磁性滑动件的顶部中的槽中，并固定到位，该位置在设置有凹槽的半芯的基端和滑块的顶部之间提供精确的齐平关系。 滑块从底部被研磨以暴露插入槽中的环形芯的端部以产生头部组件。 环形芯的一侧从头部组件中的滑块插入。 当一个或多个头部组件安装在基座上时，突出侧保持与由夹具提供的参考直立平面接触，以确定头部组件的定位，使得相应环形芯中的间隙精确地延伸在 磁带的运行方向，从而防止方位角损失。
-
-
-
-
搜索结果
5 条记录 (耗时 0.02 秒)
