X-ray image pickup apparatus, X-ray image pickup method, and X-ray image pickup apparatus monitoring method

    公开(公告)号:US10022099B2

    公开(公告)日:2018-07-17

    申请号:US14914355

    申请日:2014-10-22

    Applicant: Hitachi, Ltd.

    Abstract: A change of X-ray radiation quality due to a material existing between an X-ray source and a detection element is estimated and corrected. Accordingly, deterioration of material discrimination ability in a dual energy imaging method can be prevented. An X-ray imaging apparatus is provided with an inherent filtration calculator configured to use measured data obtained by imaging air at two or more types of different tube voltages to calculate a deviation from a reference radiation quality, as a transmission length (inherent filtration) of a predetermined reference material. A reference-material transmission-length conversion is applied to the measured data according to the dual energy imaging method, thereby calculating the reference material transmission length (inherent filtration). When a subject is imaged, the dual energy imaging is performed by adding the inherent filtration calculated as to each detection element, and this produces an image with the change of radiation quality having been corrected.

    Radiation imaging apparatus
    5.
    发明授权

    公开(公告)号:US11169284B2

    公开(公告)日:2021-11-09

    申请号:US16719528

    申请日:2019-12-18

    Applicant: Hitachi, Ltd.

    Abstract: The present invention provides a radiation imaging apparatus capable of maintaining the quality of an image obtained even when a dose incident on a radiation detector changes suddenly. The present invention is a radiation imaging apparatus including a radiation source, a radiation detector to detect radiation emitted from the radiation source, and a cooling unit to cool the radiation detector; and is characterized in that the radiation detector has a counting circuit to output a number of photons in radiation counted per unit time as a photon counting rate, and the cooling unit controls a coolability of the radiation detector in response to the photon counting rate.

    Radiation imaging system
    6.
    发明授权

    公开(公告)号:US11029423B2

    公开(公告)日:2021-06-08

    申请号:US16808774

    申请日:2020-03-04

    Applicant: Hitachi, Ltd.

    Abstract: To provide a radiation imaging system which is adapted to downsize a photon counting radiation detector including a semiconductor layer for detecting photons of radiation and a collimator for suppressing incidence of scattered rays, and which ensures high voltage resistance. The radiation imaging system includes: a radiation source; a radiation detector; and a support portion for supporting the radiation source and the radiation detector in opposed relation. The system has a structure wherein the radiation detector includes a plurality of detecting element modules arranged in an arcuate form. The detecting element module includes a base fixed to the support portion; a semiconductor layer; a high-voltage wire for supplying high voltage to the semiconductor layer; a collimator for suppressing scattered rays, and a supporting column disposed at place within a predetermined distance from the semiconductor layer.

    Photon-counting CT apparatus
    8.
    发明授权

    公开(公告)号:US10542947B2

    公开(公告)日:2020-01-28

    申请号:US16071810

    申请日:2016-11-17

    Applicant: Hitachi, Ltd.

    Abstract: The present invention is directed to make a photon-counting CT apparatus capable of more accurate data acquisition. Such apparatus is provided with a reference detection unit and a time measuring instrument to measure temporal fluctuations in a rotational direction of an X-ray irradiation unit. The apparatus corrects temporal fluctuations in the rotational direction involved in data measured by the reference detection unit, using time measurement data which is output by the time measuring instrument. Using corrected measurement data measured by the reference detection unit, the apparatus makes corrections of fluctuations pertaining to the X-ray tube of the X-ray irradiation unit and pile-up. Data corrections with high accuracy are thus enabled.

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