公开(公告)号：US20160064099A1

公开(公告)日：2016-03-03

申请号：US14644906

申请日：2015-03-11

Applicant: Hitachi, Ltd.

Inventor： MASANAO YAMAOKA ,  Goichi ONO ,  Chihiro YOSHIMURA ,  Masato HAYASHI

IPC: G11C29/08 ,  G11C29/00

CPC classification number: G11C29/08 ,  G06N7/005 ,  G06N99/002 ,  G11C29/76

Abstract: A semiconductor device capable of easily and properly detecting a defective element unit(s) and a quality management method for the semiconductor device are suggested. A semiconducting device simulating interactions between nodes in an interaction model is equipped with a quality management unit for managing the quality of each element unit provided corresponding to each node, wherein the quality management unit executes a specified quality test of each element unit, compares test results of the quality test with pre-given results to be obtained from the quality test, and detects a defective memory cell(s) and a defective element unit(s) based on the comparison results.

Abstract translation: 建议能够容易且适当地检测缺陷元件单元的半导体器件和半导体器件的质量管理方法。 模拟交互模型中节点之间的交互的半导体装置配备有用于管理对应于每个节点提供的每个元素单元的质量的质量管理单元，其中质量管理单元执行每个元素单元的指定质量测试，比较测试结果 的质量测试，并从质量测试中获得预先给定的结果，并且基于比较结果来检测有缺陷的存储单元和有缺陷的元件单元。