公开(公告)号：US20250095956A1

公开(公告)日：2025-03-20

申请号：US18728002

申请日：2022-01-27

Applicant: Hitachi High-Tech Corporation

Inventor： Hang DU ,  Toshiyuki YOKOSUKA ,  Yuko SASAKI ,  Yasuko WATANABE ,  Megumi KIMURA

IPC: H01J37/28 ,  H01J37/08 ,  H01J37/22

Abstract: Provided is a charged particle beam inspection system that can derive an optimal observation condition using an image prediction model obtained by machine learning of simulation results. The charged particle beam inspection system includes: a charged particle beam irradiation device configured to acquire an image of a sample; and an observation condition search device configured to search for an observation condition of the charged particle beam irradiation device and control image acquisition performed by the charged particle beam irradiation device. The observation condition search device acquires a module including a learning device subjected to training using labeled training data, which includes a plurality of simulation images obtained by inputting image generation condition including a plurality of first device conditions and a plurality of first sample conditions into a simulator and the first image generation condition, sets a plurality of second device conditions in an image generation tool to acquire a plurality of output images output by the image generation tool, collates the plurality of output images with an image obtained by inputting the first sample condition and the second device condition to the learning device, and generates a second sample condition based on the collation result.