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公开(公告)号：US20240280476A1
公开(公告)日：2024-08-22
申请号：US18571281
申请日：2021-07-20
Applicant: HITACHI HIGH-TECH CORPORATION
Inventor： Megumi MIZUNO , Naomi ISHII , Sakiko NARIKAWA
CPC classification number: G01N21/31 , G01N21/255
Abstract: The analysis device is provided with multiple reference samples which differ in transmittance and color, a storage unit which stores the brightness values, and a control value of the light source. The control unit irradiates the reference sample with light at a set control value, and stores an acquired measured brightness value of the reference sample, and an adjustment control value of the light source for adjusting to a set reference brightness value; from the brightness value of a sample to be measured, which was acquired by irradiating the sample to be measured with light on the basis of the control value, the control unit calculates an adjustment control value of the light source on the basis of the relation between the adjustment control value of the light source and the brightness value of the sample to be measured, and uses the adjustment control value to irradiate light.
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公开(公告)号：US20240183870A1
公开(公告)日：2024-06-06
申请号：US18279438
申请日：2021-03-09
Applicant: Hitachi High-Tech Corporation
Inventor： Sakiko NARIKAWA , Naomi ISHII , Megumi MIZUNO
CPC classification number: G01N35/00603 , G01N1/38 , G01N35/00069 , G01N2035/00168
Abstract: An analysis device according to the present invention comprises: at least one inspection device that inspects a specimen; and at least one specimen production device that produces a specimen. The analysis device is provided with a data processing unit that processes data. The inspection device and the specimen production device are each provided with a communication unit for communicating with each other. The specimen production device is provided with a control unit that controls the specimen production device and a production unit that produces a specimen. The inspection device is provided with a control unit that controls the inspection device and an inspection unit that inspects a specimen. The data processing unit calculates a value [number of specimens A] representing the number of specimens which have not been delivered to the inspection device and a value [number of specimens B] representing the sum of the number of specimens for which inspection can be additionally started in the inspection device and the number of specimens which are being inspected and the inspection of which will be completed in a prescribed time. The control unit of the specimen production device prohibits production of a new specimen in the specimen production device when the [number of specimens A] and the [number of specimens B] satisfy a first relationship.
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