公开(公告)号：US20150268169A1

公开(公告)日：2015-09-24

申请号：US14661821

申请日：2015-03-18

Applicant: Hitachi High-Tech Science Corporation

Inventor： Yutaka Ikku ,  Hidenori Tanabe

IPC: G01N21/73 ,  G01J3/04 ,  G01J3/443

CPC classification number: G01J3/443 ,  G01J3/0216 ,  G01J3/024 ,  G01N21/68

Abstract: An ICP optical emission spectrometer including: an inductively coupled plasma device configured to atomize or ionize target element to be analyzed using inductively coupled plasma to obtain an atomic emission line; a light condenser configured to condense the atomic emission line, the light condenser including at least two independent light condensers including a first light condenser and a second light condenser; a spectroscope configured to receive the atomic emission line through an incident window and to spectrally detect the atomic emission line; and at least one incident slit that is provided between the first light condenser and the second light condenser, the incident slit being configured to allow the atomic emission line, which passed through the first light condenser, pass through the incident slit and reach to the second light condenser.

Abstract translation: 一种ICP发射光谱仪，包括：感应耦合等离子体装置，被配置为使用电感耦合等离子体来雾化或电离待分析的目标元件以获得原子发射线; 光聚光器，被配置为冷凝原子发射线，所述光聚光器包括至少两个独立的光聚光器，包括第一光聚光器和第二光聚光器; 配置成通过入射窗口接收原子发射线并且光谱检测原子发射线的分光镜; 以及设置在所述第一光聚光器和所述第二光聚光器之间的至少一个入射狭缝，所述入射狭缝被配置为允许穿过所述第一光聚光器的所述原子发射线穿过所述入射狭缝并到达所述第二光聚合器 光冷凝器。