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公开(公告)号：US12001004B2
公开(公告)日：2024-06-04
申请号：US17644649
申请日：2021-12-16
发明人： Robert Eric Betzig , Tsung-Li Liu , Daniel E. Milkie , Kai Wang , Wesley Legant
CPC分类号： G02B21/361 , G01N21/64 , G01N21/6428 , G01N21/6458 , G02B21/0032 , G02B21/0072 , G02B21/0076 , G02B21/06 , G02B21/367 , G02B26/06 , G02B27/0025 , G02B27/58 , G02B2207/114
摘要： A microscope directs light through an excitation objective to generate a lattice light sheet (LLS) within a sample. A detection objective collects signal light from the sample in response to the LLS and images the collected light onto a detector. Second and third light beams are imaged onto focal planes of the excitation objective and detection objective, respectively. One or more wavefront detectors determine wavefronts of light emitted from the sample and through the excitation objective in response to the imaged second light beam and emitted from the sample through the detection objective in response to the imaged third light beam. A wavefront of the first light beam is modified to reduce a sample-induced aberration of the LLS within the sample, and a wavefront of the signal light emitted from the sample is modified to reduce a sample-induced aberration of the signal light at the detector.
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公开(公告)号：US11221476B2
公开(公告)日：2022-01-11
申请号：US16159579
申请日：2018-10-12
发明人： Robert Eric Betzig , Tsung-Li Liu , Daniel E. Milkie , Kai Wang , Wesley Legant
摘要： A microscope directs light through an excitation objective to generate a lattice light sheet (LLS) within a sample. A detection objective collects signal light from the sample in response to the LLS and images the collected light onto a detector. Second and third light beams are imaged onto focal planes of the excitation objective and detection objective, respectively. One or more wavefront detectors determine wavefronts of light emitted from the sample and through the excitation objective in response to the imaged second light beam and emitted from the sample through the detection objective in response to the imaged third light beam. A wavefront of the first light beam is modified to reduce a sample-induced aberration of the LLS within the sample, and a wavefront of the signal light emitted from the sample is modified to reduce a sample-induced aberration of the signal light at the detector.
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公开(公告)号：US20220317433A1
公开(公告)日：2022-10-06
申请号：US17644649
申请日：2021-12-16
发明人： Robert Eric Betzig , Tsung-Li Liu , Daniel E. Milkie , Kai Wang , Wesley Legant
摘要： A microscope directs light through an excitation objective to generate a lattice light sheet (LLS) within a sample. A detection objective collects signal light from the sample in response to the LLS and images the collected light onto a detector. Second and third light beams are imaged onto focal planes of the excitation objective and detection objective, respectively. One or more wavefront detectors determine wavefronts of light emitted from the sample and through the excitation objective in response to the imaged second light beam and emitted from the sample through the detection objective in response to the imaged third light beam. A wavefront of the first light beam is modified to reduce a sample-induced aberration of the LLS within the sample, and a wavefront of the signal light emitted from the sample is modified to reduce a sample-induced aberration of the signal light at the detector.
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公开(公告)号：US20190113731A1
公开(公告)日：2019-04-18
申请号：US16159579
申请日：2018-10-12
发明人： Robert Eric Betzig , Tsung-Li Liu , Daniel E. Milkie , Kai Wang , Wesley Legant
摘要： A microscope directs light through an excitation objective to generate a lattice light sheet (LLS) within a sample. A detection objective collects signal light from the sample in response to the LLS and images the collected light onto a detector. Second and third light beams are imaged onto focal planes of the excitation objective and detection objective, respectively. One or more wavefront detectors determine wavefronts of light emitted from the sample and through the excitation objective in response to the imaged second light beam and emitted from the sample through the detection objective in response to the imaged third light beam. A wavefront of the first light beam is modified to reduce a sample-induced aberration of the LLS within the sample, and a wavefront of the signal light emitted from the sample is modified to reduce a sample-induced aberration of the signal light at the detector.
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