Test System for Memory Card
    1.
    发明申请

    公开(公告)号:US20220074986A1

    公开(公告)日:2022-03-10

    申请号:US17418576

    申请日:2019-07-17

    Abstract: A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

    Test system for memory card
    2.
    发明授权

    公开(公告)号:US12038470B2

    公开(公告)日:2024-07-16

    申请号:US17418576

    申请日:2019-07-17

    Abstract: A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

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