公开(公告)号：US12038470B2

公开(公告)日：2024-07-16

申请号：US17418576

申请日：2019-07-17

Applicant: Huawei Technologies Co., Ltd.

Inventor： Weiwen Pang ,  Xiaoqiang Li

IPC: G01R31/28 ,  G01R31/317 ,  G01R31/3181

CPC classification number: G01R31/2805 ,  G01R31/2841 ,  G01R31/2886 ,  G01R31/31728 ,  G01R31/31813

Abstract: A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.

公开(公告)号：US20220074986A1

公开(公告)日：2022-03-10

申请号：US17418576

申请日：2019-07-17

Applicant: Huawei Technologies Co., Ltd.

Inventor： Weiwen Pang ,  Xiaoqiang Li

IPC: G01R31/28 ,  G01R31/3181 ,  G01R31/317

Abstract: A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.