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1.发明授权Methods of improving electrical characteristics of semiconductor devices and products so produced 失效改善如此制造的半导体器件和产品的电气特性的方法
公开(公告)号：US3303059A
公开(公告)日：1967-02-07
申请号：US37886264
申请日：1964-06-29
Applicant: IBM
Inventor： KERR DONALD R , HOPEWELL JUNCTION , YOUNG DONALD R
IPC: H01L23/29 , H01L23/522 , H01L27/00 , H01L27/06 , H01L29/00
CPC classification number: H01L27/00 , H01L23/291 , H01L23/522 , H01L27/0635 , H01L27/0652 , H01L29/00 , H01L2924/0002 , Y10S438/91 , H01L2924/00
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