公开(公告)号：US3893071A

公开(公告)日：1975-07-01

申请号：US49851074

申请日：1974-08-19

Applicant: IBM

Inventor： BOSSEN DOUGLAS C ,  HSIAO MU-YUE ,  PATEL ARVIN M

IPC: G06F12/16 ,  G06F11/10 ,  H04L1/10 ,  G11C29/00

CPC classification number: G06F11/1028

Abstract: This specification describes an error correction system for a high density memory made up of a number of monolithic wafers each containing a plurality of arrays that are addressed thru circuitry and wiring contained on that wafer. The storage bits on the wafers are functionally divided into a number of blocks each containing a plurality of words. The words of each block are on several wafers with each word made up of a plurality of arrays on a single array wafer. Each word in a block is protected by a similar error correction double multiple error detection code. The block is further protected by two additional check words made up using a b-adjacent code. Each byte in the check words protects one byte position of the words of the block. When a single error is detected in any word by the SEC-MED code the code corrects the error. If a multiple error is detected, the multiple error signal points to the word in error to be corrected by the b-adjacent code check words.

Abstract translation: 本说明书描述了用于由多个单片晶片组成的高密度存储器的纠错系统，每个单片晶片包含通过电路和包含在该晶片上的布线来寻址的多个阵列。 晶片上的存储位在功能上被划分为多个块，每个块包含多个单词。 每个块的单词在几个晶片上，每个单词由单个阵列晶片上的多个阵列组成。 块中的每个字都受到类似的纠错双重错误检测码的保护。 该块进一步受到使用b相邻代码组成的两个附加检查词的保护。 检查字中的每个字节保护块的字的一个字节位置。 当SEC-MED代码在任何单词中检测到单个错误时，代码将纠正错误。 如果检测到多重错误，则多个错误信号指向错误的单词，以便通过b相邻的代码检查字进行纠正。