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1.Method of modifying electrical characteristic of semiconductor member 失效
Title translation: 修改半导体元件电气特性的方法公开(公告)号:US3333326A
公开(公告)日:1967-08-01
申请号:US37885064
申请日:1964-06-29
Applicant: IBM
Inventor: THOMAS JR JACOB E , YOUNG DONALD R
IPC: H01L23/29 , H01L23/522 , H01L27/06 , H01L29/00
CPC classification number: H01L23/522 , H01L23/291 , H01L27/0635 , H01L27/0652 , H01L29/00 , H01L2924/0002 , Y10S438/91 , Y10T29/49082 , H01L2924/00