公开(公告)号：US11156516B2

公开(公告)日：2021-10-26

申请号：US16085791

申请日：2016-12-19

Applicant: IHI Corporation

Inventor： Hatsuo Mori ,  Keisuke Suzuki ,  Noriyoshi Mizukoshi ,  Takashi Ogai

IPC: G01L7/18 ,  F02K9/52 ,  F04D29/22 ,  F04D15/00 ,  G01M13/00 ,  G01M5/00 ,  G05B23/02 ,  F02K9/46 ,  F02K9/50 ,  G01L27/02

Abstract: An abnormality determination device according to one aspect of the present disclosure is an abnormality determination device that determines an abnormality of an inducer used for a pump, the abnormality determination device including a stress-response acquisition unit that acquires a stress response indicating a temporal change in stress applied to the inducer, an accumulated-fatigue-damage-degree calculation unit that calculates an accumulated fatigue-damage degree of the inducer based on the stress response, a lifetime-consumption-rate calculation unit that calculates a lifetime consumption rate that is a changing rate of the accumulated fatigue-damage degree with respect to time, and a determination unit that determines an abnormality of the inducer based on the accumulated fatigue-damage degree and the lifetime consumption rate, in which the inducer is used only for a predetermined use time per operation of the pump.