公开(公告)号：US20240344909A1

公开(公告)日：2024-10-17

申请号：US18412648

申请日：2024-01-15

Applicant: IIDA Co., Ltd.

Inventor： Shigeo MIYAKE ,  Shuichi NOWATARI ,  Hidemi HANADA

IPC: G01L1/24 ,  G01N21/3581

CPC classification number: G01L1/248 ,  G01N21/3581 ,  G01N2201/061

Abstract: An objective of the present invention is to quantitatively estimate the residual stress of an object. The present invention provides a method for estimating the residual stress of an object, the method comprising: irradiating an object with terahertz waves; measuring polarization intensity of the terahertz waves transmitted through or reflected by the object; and calculating tensile stress of the object based on the measured polarization intensity. In one embodiment, calculating the tensile stress includes calculating the tensile stress based on a relationship between polarization intensity and tensile stress derived from: a relationship between polarization intensity and tensile distance; and a relationship between tensile distance and tensile stress.