METHODS AND SYSTEMS FOR ESTIMATING RESIDUAL STRESS IN OBJECT

    公开(公告)号:US20240344909A1

    公开(公告)日:2024-10-17

    申请号:US18412648

    申请日:2024-01-15

    Applicant: IIDA Co., Ltd.

    CPC classification number: G01L1/248 G01N21/3581 G01N2201/061

    Abstract: An objective of the present invention is to quantitatively estimate the residual stress of an object. The present invention provides a method for estimating the residual stress of an object, the method comprising: irradiating an object with terahertz waves; measuring polarization intensity of the terahertz waves transmitted through or reflected by the object; and calculating tensile stress of the object based on the measured polarization intensity. In one embodiment, calculating the tensile stress includes calculating the tensile stress based on a relationship between polarization intensity and tensile stress derived from: a relationship between polarization intensity and tensile distance; and a relationship between tensile distance and tensile stress.

    METHOD AND SYSTEM FOR ESTIMATING CONVERGENCE OF CHANGES IN DIMENSIONS OF MOLDED ARTICLE OVER TIME

    公开(公告)号:US20220146257A1

    公开(公告)日:2022-05-12

    申请号:US17270856

    申请日:2020-02-27

    Abstract: An objective of the present invention is to provide a method, or the like, for estimating the convergence of dimensional changes in a molded article over time, by utilizing the polarization intensity of terahertz waves. The present invention provides a method for estimating the convergence of changes in the dimensions of a molded article over time, the method comprising: irradiating a molded article with terahertz waves at multiple positions thereon, wherein the molded article is irradiated with the terahertz waves at each position thereon in multiple orientations about the optical axis; measuring polarization intensities of the terahertz waves transmitted through or reflected from the molded article; and determining whether the polarization intensities at the multiple positions are in a given relationship with each other.

Patent Agency Ranking