Coating thickness gauge
    1.
    发明授权
    Coating thickness gauge 失效
    涂层厚度计

    公开(公告)号:US3848125A

    公开(公告)日:1974-11-12

    申请号:US18183671

    申请日:1971-09-20

    Inventor: UTT O EVANS H

    CPC classification number: G01N23/223 G01B15/02 G01N2223/076

    Abstract: Disclosed is a system for measuring the thickness of a zinc coating on an iron sheet wherein the coating and substrate are irradiated by a continuous X-ray beam source. The beam is propagated in a first or positive direction away from the source through a reference chamber to the coating and substrate. In response to fluorescence of the coating and substrate due to Xray irradiation, secondary X-rays are derived and propagate in a second or negative direction generally towards the source. The intensity of the negatively directed X-rays is determined with a measuring chamber concentric with the reference chamber. The reference and measuring chambers include a noble gas that is ionized in response to the X-rays impinging thereon. Gases flow between the two chambers by a structure which prevents coupling of ions between the chambers, whereby the relative sensitivity of the two chambers is equalized. Responses from the two chambers are combined to provide a signal that is independent of intensity variations of the X-ray beam source. The combined signal is electronically processed to provide an output signal directly proportional to the zinc coating. Standardization of the gauge is performed by substituting first and second samples, respectively having no and a predetermined amount of zinc on an iron substrate, for the sheet being measured for coating thickness.

    Abstract translation: 公开了一种用于测量铁片上锌涂层的厚度的系统,其中涂层和基底被连续的X射线束源照射。 光束以第一或正方向通过参考室远离光源传播到涂层和基底。 响应于由于X射线照射引起的涂层和基底的荧光,二次X射线被导出并且通常朝向源的第二或负方向传播。 通过与参考室同心的测量室确定负向X射线的强度。 参考和测量室包括响应于其上照射的X射线而电离的惰性气体。 气体通过防止室之间的离子耦合的结构在两个室之间流动,由此两个室的相对灵敏度相等。 来自两个室的响应被组合以提供独立于X射线束源的强度变化的信号。 组合信号被电子处理以提供与锌涂层成正比的输出信号。 通过将第一和第二样品分别替换为在铁基材上没有和预定量的锌以测量涂层厚度来进行标准化。

    X-ray gauging method and apparatus with stabilized response
    2.
    发明授权
    X-ray gauging method and apparatus with stabilized response 失效
    X射线测量方法和设备具有稳定的响应

    公开(公告)号:US3843884A

    公开(公告)日:1974-10-22

    申请号:US18183771

    申请日:1971-09-20

    Inventor: EVANS H

    CPC classification number: G01B15/02 G01N23/223 G01N2223/076

    Abstract: Disclosed is a system for measuring the thickness of a zinc coating on an iron sheet wherein the coating and substrate are irradiated by a continuous X-ray beam source. The beam is propagated in a first or positive direction away from the source through a reference chamber to the coating and substrate. By fluorescence of the coating and substrate in response to the Xray irradiation, secondary X-rays are derived and propagate in a second or negative direction generally towards the source. The intensity of the negatively directed X-rays is determined with a measuring chamber concentric with the reference chamber. The reference and measuring chambers include a noble gas that is ionized in response to the X-rays impinging thereon. Gases are permitted to flow between the two chambers by a structure which prevents coupling of ions between the chambers, and whereby the relative sensitivity of the two chambers is equalized. Responses from the two chambers are combined to provide a signal that is independent of intensity variations of the X-ray beam source. The combined signal is electronically processed to provide an output signal directly proportional to the zinc coating. Standardization of the gauge is performed by substituting first and second samples, respectively having no zinc and a predetermined amount of zinc on an iron substrate, for the sheet being measured for coating thickness.

    Abstract translation: 公开了一种用于测量铁片上锌涂层的厚度的系统,其中涂层和基底被连续的X射线束源照射。 光束以第一或正方向通过参考室远离光源传播到涂层和基底。 通过响应于X射线照射的涂层和基底的荧光,二次X射线被导出并且在一般朝向源的第二或负方向传播。 通过与参考室同心的测量室确定负向X射线的强度。 参考和测量室包括响应于其上照射的X射线而电离的惰性气体。 允许气体通过防止室之间的离子耦合的结构在两个室之间流动,并且由此两个室的相对灵敏度相等。 来自两个室的响应被组合以提供独立于X射线束源的强度变化的信号。 组合信号被电子处理以提供与锌涂层成正比的输出信号。 通过将第一和第二样品分别替换为在铁基材上没有锌和预定量的锌,对被测量的片材进行涂层厚度来进行标准化。

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