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公开(公告)号：US3435220A
公开(公告)日：1969-03-25
申请号：US3435220D
申请日：1965-02-26
Applicant: INDUSTRIAL NUCLEONICS CORP
Inventor： HANKEN ALBERT F
CPC classification number: G01N23/083
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2.发明授权Compensation of dielectric gauge systems for non-uniform distribution of the constituents in measured materials 失效对测量材料中组分不均匀分布的电介质测量系统的补偿
公开(公告)号：US3249865A
公开(公告)日：1966-05-03
申请号：US23016762
申请日：1962-10-12
Applicant: INDUSTRIAL NUCLEONICS CORP
Inventor： HANKEN ALBERT F
IPC: G01N27/22
CPC classification number: G01N27/223
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3.发明授权System for quantitatively measuring a property of dielectric material by applying input signals at two different frequencies to a capacitance probe and varying the frequency of one input signal to maintain a constant ratio of output signals for the two frequencies 失效用于通过以两个不同频率将输入信号施加到电容探针并改变一个输入信号的频率来定量测量介电材料的性质的系统，以保持两个频率的输出信号的恒定比率
公开(公告)号：US3323049A
公开(公告)日：1967-05-30
申请号：US52866765
申请日：1965-12-07
Applicant: INDUSTRIAL NUCLEONICS CORP
Inventor： HANKEN ALBERT F
IPC: G01N27/22
CPC classification number: G01N27/223
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