Shielded focusing electrode assembly for a photomultiplier tube
    1.
    发明授权
    Shielded focusing electrode assembly for a photomultiplier tube 失效
    用于光电倍增管的屏蔽聚焦电极组件

    公开(公告)号:US4376246A

    公开(公告)日:1983-03-08

    申请号:US227342

    申请日:1981-01-22

    CPC classification number: H01J43/06

    Abstract: An improved photomultiplier tube comprises an evacuated envelope having a faceplate extending across one end thereof. A photoemissive cathode is disposed on the interior surface of the faceplate. A support electrode having a centrally located aperture therethrough is spaced from the faceplate. An electron multiplier assembly is attached to the support electrode. A focusing assembly is disposed about the centrally located aperture in the support electrode on a side of the support electrode opposite the electron multiplier assembly. The focusing electrode assembly comprises an insulating member having a generally tubular body with an interior surface and an exterior surface and having a proximal end and a distal end. A top-cap, having a substantially U-shaped cross-section including a flat central base and two mutually parallel projections at the ends of the base, is attached to the distal end of the insulating member. The parallel projections are directed toward the support electrode and extend along at least a portion of the interior and exterior surfaces of the insulating member. At least one antimony evaporator for forming the photocathode is disposed adjacent to the focusing assembly. One of the projections at the end of the top-cap shields the exterior surface of the insulating member from antimony deposition and thus prevents electrical shorting of the focusing assembly to the support electrode. The other projection shields the interior of the insulating member from impingement by photoelectrons from the photocathode and thereby prevents electrical charging of the insulating member. A focus potential is applied to the top-cap of the focusing electrode assembly to focus the photoelectrons into the electron multiplier assembly.

    Abstract translation: 改进的光电倍增管包括具有延伸穿过其一端的面板的抽真空的外壳。 一个光发射阴极设置在面板的内表面上。 具有穿过其中心定位的孔的支撑电极与面板间隔开。 电子倍增器组件附接到支撑电极。 聚焦组件围绕支撑电极的中心定位的孔布置在与电子倍增器组件相对的支撑电极的一侧上。 聚焦电极组件包括绝缘构件,绝缘构件具有大体上具有内表面和外表面并具有近端和远端的管状体。 具有基本上U形横截面的顶盖附接到绝缘构件的远端,所述顶盖包括平坦的中心基部和在基部的端部处的两个相互平行的突起。 平行的突起指向支撑电极并且沿着绝缘构件的内表面和外表面的至少一部分延伸。 用于形成光电阴极的至少一个锑蒸发器邻近聚焦组件设置。 在顶盖末端的一个突出部分将绝缘部件的外表面与锑沉积屏蔽,从而防止聚焦组件电气短路到支撑电极。 另一个突起屏蔽绝缘构件的内部不受来自光电阴极的光电子的撞击,从而防止绝缘构件的充电。 将焦点电位施加到聚焦电极组件的顶帽以将光电子聚焦到电子倍增器组件中。

    Charge-particle energy analyzer
    2.
    发明授权
    Charge-particle energy analyzer 失效
    电荷粒子能量分析仪

    公开(公告)号:US4219730A

    公开(公告)日:1980-08-26

    申请号:US936928

    申请日:1978-08-25

    CPC classification number: H01J37/256 G01N23/225 G21K1/087 H01J49/482

    Abstract: A charged-particle energy analyzer having means for irradiating a sample with a primary electron beam, deflecting electrode means which focus charged particle flux emitted from the sample onto a center axis of the primary electron beam or onto an identical circumference with its center on the axis, a slit disposed at the focus point of the charged particles, an energy analyzer whose object point lies at the focus point, a detector for detecting the charged particles analyzed by the energy analyzer, and charged particle flux deflecting means provided between the sample and the detector, for shielding by one part of the charged particle flux focused in a true circular form, to thereby make it possible not only to set a wide accepted solid angle for signals but also to get an information as to the concave or convex surface condition of the sample at the measured portion.

    Abstract translation: 一种带电粒子能量分析仪,其具有用于用一次电子束照射样品的装置,将从样品发射的带电粒子通量聚焦到一次电子束的中心轴上的偏转电极装置或与其一致的圆周上的中心在轴上的偏转电极装置 设置在带电粒子的聚焦点的狭缝,物点在焦点处的能量分析器,用于检测由能量分析器分析的带电粒子的检测器,以及设置在样品和样品之间的带电粒子通量偏转装置 检测器,用于通过以真圆形形式聚焦的一部分带电粒子通量进行屏蔽,从而不仅能够为信号设置广泛接受的立体角,而且可以获得关于凹面或凸面状况的信息 在测量部分的样品。

    Micro-analysis processes using X-rays
    3.
    发明授权
    Micro-analysis processes using X-rays 失效
    使用X射线的微分析过程

    公开(公告)号:US4218617A

    公开(公告)日:1980-08-19

    申请号:US964031

    申请日:1978-11-27

    Applicant: Jacques Cazaux

    Inventor: Jacques Cazaux

    CPC classification number: G01N23/227

    Abstract: A process and device for micro-analysis in which a thin layer of anticathode material is scanned by means of a pencil-beam of electrons. The X-rays formed are received by a thin layer of converter where they give rise to a current of photoelectrons which is subject to an intensity measurement by an analyser.From the measurement of intensity of the photoelectrons are deduced the properties of the zone of the anticathode which receives the pencil-beam.

    Abstract translation: 用于微分析的方法和装置,其中通过电子束的铅笔束扫描薄层的反阴极材料。 所形成的X射线被转换器的薄层接收,在那里它们产生通过分析仪进行强度测量的光电子的电流。 从光电子的强度的测量推导出接受铅笔束的抗电极的区域的性质。

    Fast response electron spectrometer
    4.
    发明授权
    Fast response electron spectrometer 失效
    快速响应电子光谱仪

    公开(公告)号:US4184073A

    公开(公告)日:1980-01-15

    申请号:US909412

    申请日:1978-05-25

    Inventor: Raine M. Gilbert

    CPC classification number: H01J49/025 G01T1/29

    Abstract: An electron spectrometer having a wide bandwidth and a high signal-to-noise ratio. Each electron channel sensor is the termination of a 50-ohm transmission line thereby eliminating series inductance and minimizing parallel capacitance, and resulting in increased bandwidths. A metallic grounding screen is provided between the sensor array and the curving chamber of the spectrometer, thereby completely isolating the sensors from the electromagnetic fields in the curving chamber, and resulting in an increased signal-to-noise ratio.

    Abstract translation: 具有宽带宽和高信噪比的电子能谱仪。 每个电子通道传感器是50欧姆传输线的终止,从而消除串联电感并最小化并联电容,并导致带宽增加。 在传感器阵列和光谱仪的弯曲室之间提供金属接地屏,从而将传感器与弯曲室中的电磁场完全隔离,并产生增加的信噪比。

    Scanning auger microprobe with variable axial aperture
    5.
    发明授权
    Scanning auger microprobe with variable axial aperture 失效
    扫描具有可变轴向孔径的螺旋钻探头

    公开(公告)号:US4048498A

    公开(公告)日:1977-09-13

    申请号:US719463

    申请日:1976-09-01

    CPC classification number: H01J49/482

    Abstract: A scanning Auger microprobe in a cylindrical mirror analyzer is provided wherein an aperture plate at the exit stage is controllably variable in aperture size and is positioned near the second order focus point and at the minimum trace of the analyzer. Control of the aperture size is provided in both an infinitely variable arrangement and in a three size exit aperture arrangement.

    Abstract translation: 提供了一种在圆柱形镜面分析仪中的扫描螺旋微探针,其中出射台处的孔板在孔径尺寸上是可控的可变的,并且位于第二阶焦点附近和分析器的最小迹线附近。 孔径尺寸的控制以无级可变布置和三尺寸出口孔布置提供。

    Depth profile analysis apparatus
    7.
    发明授权
    Depth profile analysis apparatus 失效
    深度剖面分析装置

    公开(公告)号:US3916190A

    公开(公告)日:1975-10-28

    申请号:US44737874

    申请日:1974-03-01

    CPC classification number: G01N23/203

    Abstract: An apparatus and method for depth profile analysis in which atoms are removed from a surface by sputtering thereby forming a crater from successively exposed portions of a solid, which portions are then elementally analyzed. The improvement of the present invention comprises deflecting a primary ion beam across the surface to form a crater extending about a predetermined region of the surface and enabling the production of a signal indicative of surface atoms of a given mass only when the primary ion beam is impinging upon a smaller portion of the predetermined region, thereby ensuring that the signal is representative of atoms within the smaller portion, such as at the bottom of the crater.

    Abstract translation: 用于深度分布分析的装置和方法,其中通过溅射从表面除去原子,从而从固体的连续暴露部分形成凹坑,然后对该部分进行元素分析。 本发明的改进包括使主离子束偏转穿过表面以形成围绕表面的预定区域延伸的凹坑,并且仅当主离子束入射时才能产生指示给定质量块的表面原子的信号 在预定区域的较小部分上,从而确保信号代表较小部分内的原子,例如在火山口的底部。

    High temperature photoelectric gas multiplication ultraviolet ray sensor
    9.
    发明授权
    High temperature photoelectric gas multiplication ultraviolet ray sensor 失效
    高温光电气体超声波紫外线传感器

    公开(公告)号:US3793552A

    公开(公告)日:1974-02-19

    申请号:US3793552D

    申请日:1972-07-19

    Applicant: GEN ELECTRIC

    CPC classification number: H01J47/00

    Abstract: An ultraviolet ray sensor for operating at high temperature includes a gas-filled sealed unit which encloses a photocathode having a spherically-shaped metal crystalline end and a ray collecting means for gathering and focussing incident rays on the photocathode. The sealed unit is made of a ceramic body with one end open to admit ultraviolet rays, that end being sealed by an ultraviolet ray transmissive window, the envelope of this sensor being capable of operating in air without oxidation or release of gas from the inner walls up to temperatures in excess of 600* C.

    Abstract translation: 用于在高温下操作的紫外线传感器包括封闭具有球状金属结晶端的光电阴极的气体填充密封单元和用于聚集和聚焦入射光线在光电阴极上的射线收集装置。 密封单元由陶瓷体制成,其一端敞开以允许紫外线照射,其端部被紫外线透射窗口密封,该传感器的外壳能够在空气中操作而没有氧化或从内壁释放气体 温度超过600℃

    Infrared intrusion detector system
    10.
    发明授权
    Infrared intrusion detector system 失效
    红外线入侵检测系统

    公开(公告)号:US3703718A

    公开(公告)日:1972-11-21

    申请号:US10466771

    申请日:1971-01-07

    Inventor: BERMAN HERBERT L

    CPC classification number: G08B13/19 Y10S250/01

    Abstract: Infrared intrusion detector system utilizing a single sensing element and optical means for focusing radiation from one or more discrete fields of view onto the sensing element. An amplifier tuned to have a frequency response corresponding to the walking speed of an intruder amplifies the signal from the sensing element and provides means for discriminating between changes in infrared radiation due to the presence of an intruder and gradual temperature changes such as room or ambient changes.

    Abstract translation: 使用单个感测元件的红外入侵检测器系统和用于将来自一个或多个离散视场的辐射聚焦到感测元件上的光学装置。 调整为具有对应于入侵者的步行速度的频率响应的放大器放大来自感测元件的信号,并提供用于鉴别由于入侵者的存在而引起的红外辐射的变化和逐渐变化的温度变化(例如房间或环境变化)的装置 。

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