公开(公告)号：US20170082536A1

公开(公告)日：2017-03-23

申请号：US15369190

申请日：2016-12-05

Applicant: Industrial Technology Research Institute

Inventor： Chia-Liang YEH ,  Yi-Chang CHEN ,  Yi-Sha KU ,  Chun-Wei LO

IPC: G01N21/47

CPC classification number: G01N21/4788 ,  G01B11/24 ,  G01B2210/56 ,  G01N21/4785 ,  G01N21/4795 ,  G01N2021/4711 ,  G01N2201/068 ,  H01L22/00 ,  H01L22/12

Abstract: A scattering measurement system is provided, including: a light source generator for generating a detection light beam with discontinuous multi-wavelengths, and generating a multi-order diffraction light beam with three-dimensional feature information when the detection light beam is incident on an object; a detector having a photosensitive array for receiving and converting the multi-order diffraction light beam into multi-order diffraction signals with the three-dimensional feature information; and a processing module for receiving the multi-order diffraction signals and comparing the multi-order diffraction signals with multi-order diffraction feature patterns in a database so as to analyze the three-dimensional feature information of the object.

公开(公告)号：US20200167952A1

公开(公告)日：2020-05-28

申请号：US16231701

申请日：2018-12-24

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Hsin-Yi CHEN ,  Chia-Liang YEH ,  Hsin-Cheng LIN ,  Sen-Yih CHOU

IPC: G06T7/73 ,  G06T7/90

Abstract: An object identification method includes: establishing a training data base including a photographing distance of a training image and a training camera parameter; in photographing a target test object, obtaining a test image, a depth image, an RGB image and a test camera parameter; and based on the training database, the depth image and the test camera parameter, adjusting the RGB image wherein the adjusted RGB image having a size equivalent to the training image of the training database.

公开(公告)号：US20170045355A1

公开(公告)日：2017-02-16

申请号：US14974892

申请日：2015-12-18

Applicant: Industrial Technology Research Institute

Inventor： Yi-Chen HSIEH ,  Chia-Liang YEH ,  Chia-Hung CHO ,  Yi-Chang CHEN ,  Yi-Sha KU ,  Chun-Wei LO

IPC: G01B11/24

CPC classification number: G01B11/24 ,  G01B2210/56 ,  H01L22/12

Abstract: A scattering measurement system is provided, including: a light source generator for generating a detection light beam with multi-wavelengths, wherein the detection light beam is incident on an object so as to generate a plurality of multi-order diffraction light beams with three-dimensional feature information; a spatial filter for filtering out zero-order light beams from the plurality of multi-order diffraction light beams; and a detector having a photosensitive array for receiving the plurality of multi-order diffraction light beams filtered out by the spatial filter and converting the filtered plurality of multi-order diffraction light beams into multi-order diffraction signals with the three-dimensional feature information. As such, the three-dimensional structure of the object can be obtained by comparing the multi-order diffraction signals with a database.

Abstract translation: 提供了一种散射测量系统，包括：用于产生具有多波长的检测光束的光源发生器，其中检测光束入射到物体上，以便产生多个三阶衍射光束， 三维特征信息; 用于滤除来自所述多个多级衍射光束的零级光束的空间滤波器; 以及检测器，其具有用于接收由空间滤波器滤除的多个多级衍射光束的光敏阵列，并将经滤波的多个多阶衍射光束转换成具有三维特征信息的多阶衍射信号。 因此，可以通过将多阶衍射信号与数据库进行比较来获得对象的三维结构。