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公开(公告)号:US20210383880A1
公开(公告)日:2021-12-09
申请号:US16895890
申请日:2020-06-08
Applicant: Intel Corporation
Inventor: Pranav CHAVA , Aliasgar S. MADRASWALA , Sagar UPADHYAY , Bhaskar VENKATARAMAIAH
Abstract: For a nonvolatile (NV) storage media such as NAND (not AND) media that is written by a program and program verify operation, the system can apply a smart prologue operation. A smart prologue operation can selectively apply a standard program prologue, to compute program parameters for a target subblock. The smart prologue operation can selectively apply an accelerated program prologue, applying a previously-computed program parameter for a subsequent subblock of a same block of the NV storage media. Application of a prior program parameter can reduce the need to compute program parameters for the other subblocks.
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2.
公开(公告)号:US20210249092A1
公开(公告)日:2021-08-12
申请号:US16786948
申请日:2020-02-10
Applicant: INTEL CORPORATION
Inventor: Tarek Ahmed AMEEN BESHARI , Pranav CHAVA , Shantanu R. RAJWADE , Sagar UPADHYAY
Abstract: Provided are an apparatus, memory device, and method for using variable voltages to discharge electrons from a memory array during verify recovery operations. In response to verifying voltages in memory cells of the non-volatile memory array programmed during a programming pulse applying charges to the storage cells, a memory controller concurrently applies voltages on wordlines of the non-volatile memory array to clear the non-volatile memory array of electrons and applies voltages to the bitlines to perform bitline stabilization.
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