Charged particle beam lens apparatus, charged particle beam column, and charged particle beam exposure apparatus

    公开(公告)号:US10049854B2

    公开(公告)日:2018-08-14

    申请号:US15335448

    申请日:2016-10-27

    Abstract: Provided is a charged particle beam lens apparatus having a small size and high resolution, and a charged particle beam column and a charged particle beam exposure apparatus.A charged particle beam lens apparatus includes a lens unit positioned around a through hole through which a charged particle beam travels, where the lens unit is configured to converge or diffuse the charged particle beam, and a supporting unit surrounding the lens unit. Here, at least one of an outer peripheral portion of the lens unit that is in contact with the supporting unit and an inner peripheral portion of the supporting unit that is in contact with the lens unit includes a groove through which a coolant fluid flows along an outer periphery of the lens unit.In this way, the charged particle beam lens apparatus can achieve a small size and high resolution.

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