Abstract:
Provided are a method, apparatus, and a system for measuring latency of a storage device. The storage device measures one or more latencies of one or more input/output (I/O) operations received from a host. The storage device transmits information on the one or more latencies to the host.
Abstract:
A first context of a non-volatile memory device is stored starting from a first location of a band of the non-volatile memory device, and an indication is made in a metadata that the first context has been stored starting from the first location of the band. A second context of the non-volatile memory device is stored starting from a second location of the band and an indication is made in the metadata that the second context has been stored starting from the second location of the band.
Abstract:
A data structure is maintained for performing a program operation that is allowed to be suspended to perform reads in a NAND device, where the data structure indicates a plurality of tiers, where each tier of the plurality of tiers has a number of allowed suspends of the program operation while executing in the tier, and where a sum of the number of allowed suspends for all tiers of the plurality of tiers equals a maximum allowed number of suspends of the program operation. In response to performing a resume of the program operation, after performing a read following a suspend of the program operation, a determination is made of a tier of the plurality of tiers for the program operation and a subsequent suspend of the program operation is performed only after a measure of progress of the program operation has been exceeded in the determined tier.