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公开(公告)号:US11923010B2
公开(公告)日:2024-03-05
申请号:US16828843
申请日:2020-03-24
Applicant: INTEL NDTM US LLC
Inventor: Arash Hazeghi , Pranav Kalavade , Rohit S. Shenoy , Hsiao-Yu Chang
CPC classification number: G11C16/10 , G06F3/0604 , G06F3/0659 , G06F3/0679
Abstract: A method is described. The method includes performing the following on a flash memory chip: measuring a temperature of the flash memory chip; and, changing a program step size voltage of the flash memory chip because the temperature of the flash memory chip has changed.