X-ray inspection apparatus
    1.
    发明授权

    公开(公告)号:US10830711B2

    公开(公告)日:2020-11-10

    申请号:US16356903

    申请日:2019-03-18

    Inventor: Shingo Kondo

    Abstract: An X-ray inspection apparatus includes: an X-ray emitter configured to emit an X-ray; an X-ray detector configured to detect the X-ray; a first flow passage configured to guide air to at least part of the X-ray detector; and a second flow passage configured to guide air to at least part of the X-ray detector.

    X-ray inspection device
    2.
    发明授权

    公开(公告)号:US11147149B2

    公开(公告)日:2021-10-12

    申请号:US16750968

    申请日:2020-01-23

    Abstract: An X-ray inspection device is configured to prevent water from flowing into areas of the X-ray inspection device during a washing operation. The X-ray inspection device is provided with an X-ray emitter, a cooler, a cooler cover, and an opening/closing member. The cooler cools the X-ray emitter. The cooler cover covers the cooler. Openings are formed in the cooler cover and, when open, provide interior-exterior air flow communication when the cooler is cooling the X-ray inspection device. An opening/closing member is configured for movement between an open orientation opening the opening and a closed orientation closing the openings formed in the cooler cover.

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