公开(公告)号：US20240426898A1

公开(公告)日：2024-12-26

申请号：US18743626

申请日：2024-06-14

Applicant: Infineon Technologies AG

Inventor： Faisal AHMED ,  Muhammad FURQAN ,  Stefan HERZINGER ,  Thomas OBERMUELLER

IPC: G01R31/28

Abstract: Test signal circuit for testing a radio frequency receiver circuit, including: a test signal generator configured to generate a baseband test signal, a modulator configured to modulate a local oscillator signal with the baseband test signal to generate a test signal, a first transmission element coupled between the modulator and an input of an impedance transforming element, a second transmission element coupled to an output of the impedance transforming element, the impedance transforming element configured to lower a first impedance level of the first transmission element to a second impedance level of a second transmission element, a voltage level detector coupled to the first transmission element, the voltage level detector being configured to detect a voltage level of the test signal. The disclosure further relates to a semiconductor chip including the test signal circuit and a system including the test signal circuit and a control circuit.

公开(公告)号：US20240288542A1

公开(公告)日：2024-08-29

申请号：US18440545

申请日：2024-02-13

Applicant: Infineon Technologies AG

Inventor： Muhammad FURQAN ,  Faisal AHMED

IPC: G01S7/40

CPC classification number: G01S7/4069 ,  G01S7/40 ,  G01S7/4056

Abstract: According to one implementation a signal modulated onto an RF signal is supplied to an RF frontend of a receiver channel to generate a baseband signal, which is supplied to a processing circuit configured to attenuate the baseband signal. A noise parameter of an output signal of the processing circuit is measured while the power of the signal is a first power value and the attenuation is a first attenuation value, while the power is a second power value and the attenuation is the first attenuation value, while the power is the first power value and the attenuation is a second attenuation value, and while the power is set to the second power value and the attenuation is set to the second attenuation value, to obtain first, second, third, and fourth noise values. A value representing a noise figure of the receiver channel is determined based on the noise values.

公开(公告)号：US20250102622A1

公开(公告)日：2025-03-27

申请号：US18886114

申请日：2024-09-16

Applicant: Infineon Technologies AG

Inventor： Muhammad FURQAN ,  Faisal AHMED ,  Jan Mateusz ZALESKI

IPC: G01S7/40 ,  G01S7/03 ,  G01S7/35

Abstract: The present disclosure describes an integrated radar transceiver circuit. The integrated radar transceiver circuit includes a local oscillator, LO, circuit configured to provide an LO signal having a LO frequency, a test signal generator circuit configured to generate a test signal having a test signal frequency component, an up-conversion circuit configured to mix the test signal and the LO signal to obtain an up-converted test signal, a receive channel including a down-conversion circuit configured to mix the up-converted test signal and the LO signal to obtain a down-converted test signal, a phase detector circuit configured to determine a phase of the down-converted test signal and a processor configured to determine delay information related to the integrated radar transceiver circuit based on the determined phase.

公开(公告)号：US20240393429A1

公开(公告)日：2024-11-28

申请号：US18323967

申请日：2023-05-25

Applicant: Infineon Technologies AG

Inventor： Thomas OBERMUELLER ,  Andreas SCHWARZ ,  Stefan HERZINGER ,  Bernhard BERGER ,  Stefan SCHMALZL ,  Faisal AHMED ,  Muhammad FURQAN

IPC: G01S7/40 ,  G01R29/08

Abstract: A device may include a receive (Rx) antenna input to couple an Rx antenna to an Rx chain, and a signal coupler to inject the test signal toward the Rx antenna. The device may include an Rx antenna switch to, in a first switch state, cause the Rx antenna to be isolated from the Rx chain and, in a second switch state, permit the test signal to probe the Rx antenna. The Rx chain may measure a phasor of a first baseband signal generated based on a first reflected test signal and a phasor of a second baseband signal generated based on a second reflected test signal. The device may include a control circuit to compute a complex ratio based on the phasors, compute a measured reflection coefficient based on the complex ratio and using a transfer function, and monitor an impedance matching of the Rx antenna.

公开(公告)号：US20230176185A1

公开(公告)日：2023-06-08

申请号：US17643110

申请日：2021-12-07

Applicant: Infineon Technologies AG

Inventor： Faisal AHMED ,  Muhammad FURQAN

IPC: G01S7/40 ,  H01Q3/26 ,  G01R29/08

CPC classification number: G01S7/4004 ,  G01R29/0892 ,  H01Q3/267

Abstract: A device may include a receive antenna input to couple a receive antenna to a receive chain of the device. The device may include a test signal generator to generate a test signal. The device may include a signal coupler between the receive antenna input and the receive chain. The signal coupler may include a first port to inject the first test signal into the receive antenna via the receive antenna input. The device may include a control circuit to monitor an impedance matching of the receive antenna based on one or more characteristics of a reflected signal resulting from the first test signal being injected into the receive antenna. The one or more characteristics of the reflected signal may be dependent on the impedance matching of the receive antenna.