CONTROLLED SWITCHING OF STRESS VOLTAGES IN LATERAL DMOS STRUCTURES

    公开(公告)号:US20240210467A1

    公开(公告)日:2024-06-27

    申请号:US18394821

    申请日:2023-12-22

    CPC classification number: G01R31/2884 G01R31/2834 H01L29/402

    Abstract: One exemplary embodiment relates to a circuit which is integrated into a semiconductor substrate and which comprises a lateral field effect transistor having a drift region and a field plate electrode, which is isolated from the drift region by an isolation zone. The integrated circuit further comprises a first terminal, which is coupled to the field plate electrode, for applying a test voltage to the field plate electrode in a test operating mode. An electronic switch is configured to connect the field plate electrode to a circuit node that is at a reference voltage in a normal operating mode of the integrated circuit. The integrated circuit further comprises a second terminal, which is connected to a control terminal of the electronic switch and is configured to receive a control signal for switching on or off the electronic switch.

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