公开(公告)号：US12119638B2

公开(公告)日：2024-10-15

申请号：US17313603

申请日：2021-05-06

Applicant: Intel Corporation

Inventor： Chin Fatt Chay ,  Andrew Morning-Smith ,  Boon Seong Khoo ,  Timothy Rothman ,  Yi Heng Khor

IPC: H02H5/04 ,  G08B5/38 ,  G08B21/18 ,  H02H1/00 ,  H05B45/3725 ,  H05B45/395

CPC classification number: H02H5/04 ,  G08B5/38 ,  G08B21/182 ,  H02H1/0007 ,  H05B45/3725 ,  H05B45/395

Abstract: Systems, apparatuses and methods may provide for technology that includes a solid state drive (SSD) having an enclosure, a non-volatile memory (NVM) device, a device controller coupled the NVM device, a capacitor, a backup voltage line coupled to the capacitor, and a safety assembly. The safety assembly may include a timer circuit including an input node coupled to the backup voltage line, a reset node, and an output node, an indicator circuit coupled to the output node of the timer circuit, and a temperature comparator circuit coupled to the reset node of the timer circuit, wherein if a temperature of the enclosure exceeds a threshold while a backup voltage is present on the backup voltage line, the temperature comparator circuit causes the timer circuit to trigger light pulses from the indicator circuit.

公开(公告)号：US20210257828A1

公开(公告)日：2021-08-19

申请号：US17313603

申请日：2021-05-06

Applicant: Intel Corporation

Inventor： Chin Fatt Chay ,  Andrew Morning-Smith ,  Boon Seong Khoo ,  Timothy Rothman ,  Yi Heng Khor

IPC: H02H5/04 ,  H02H1/00 ,  G08B5/38 ,  G08B21/18

Abstract: Systems, apparatuses and methods may provide for technology that includes a solid state drive (SSD) having an enclosure, a non-volatile memory (NVM) device, a device controller coupled the NVM device, a capacitor, a backup voltage line coupled to the capacitor, and a safety assembly. The safety assembly may include a timer circuit including an input node coupled to the backup voltage line, a reset node, and an output node, an indicator circuit coupled to the output node of the timer circuit, and a temperature comparator circuit coupled to the reset node of the timer circuit, wherein if a temperature of the enclosure exceeds a threshold while a backup voltage is present on the backup voltage line, the temperature comparator circuit causes the timer circuit to trigger light pulses from the indicator circuit.