ETCH STOP LAYER FOR METAL GATE CUT
    1.
    发明公开

    公开(公告)号:US20240113106A1

    公开(公告)日:2024-04-04

    申请号:US17957106

    申请日:2022-09-30

    CPC classification number: H01L27/088 H01L21/823456 H01L21/823481

    Abstract: An integrated circuit includes laterally adjacent first and second devices. The first device includes (i) first source and drain regions, (ii) a first body including semiconductor material laterally extending between the first source and drain regions, (iii) a first sub-fin below the first body, and (iv) a first gate structure on the first body. The second device includes (i) second source and drain regions, (ii) a second body including semiconductor material laterally extending from the second source and drain regions, (iii) a second sub-fin below the second body, and (iv) a second gate structure on the second body. A second dielectric material is laterally between the first and second sub-fins. A third dielectric material is laterally between the first and second sub-fins, and above the second dielectric material. A gate cut including first dielectric material is laterally between the first and second gate structures, and above the third dielectric material.

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