公开(公告)号：US10263707B2

公开(公告)日：2019-04-16

申请号：US15753121

申请日：2015-09-22

Applicant: Intel Corporation

Inventor： Thiruvikraman Vikram Sadagopan ,  Sang Yup Kim ,  Jen-Chyun Chen

IPC: H04B10/50 ,  G02F1/01 ,  H04B10/564

Abstract: Embodiments of the present disclosure are directed toward techniques and configurations for an apparatus comprising an electro-optical modulation device with a bias control and adjustment. In some embodiments, the apparatus may comprise an electro-optical modulator having first and second arms, to modulate light passing through the first and second arms in response to an input data signal, and output a corresponding optical data signal. The apparatus may further comprise a control module coupled with the electro-optical modulator, to differentially adjust respective phases of first or second light portions passing through the first and second arms, to achieve a bias point for the optical data signal. The bias point may define a desired power output of the apparatus that corresponds to the optical data signal. Other embodiments may be described and/or claimed.

公开(公告)号：US11177620B2

公开(公告)日：2021-11-16

申请号：US15705584

申请日：2017-09-15

Applicant: Intel Corporation

Inventor： Mahan Movassaghi ,  Rohit Mittal ,  Robert W. Herrick ,  Jen-Chyun Chen

IPC: H01S5/00 ,  H01S3/10 ,  H01S3/00 ,  H01S5/068 ,  H01S5/06

Abstract: In embodiments, an apparatus to predict failure of a laser is presented. The apparatus may include a memory to store a reference model of bias current change for a laser as a function of time and temperature, one or more sensors to detect: temperature, elapsed operating time and bias current of the laser, and a processor communicatively coupled to the memory and to the one or more sensors. The processor may be to calculate an actual bias current change ΔIA at a current laser temperature, and an expected bias current change ΔIE, based at least in part on the reference model and an average operating temperature, subtract ΔIE from ΔIA, and if the difference is greater than a pre-defined value α, output a signal. Related methods and non-transitory computer-readable media may also be presented.

公开(公告)号：US20190089110A1

公开(公告)日：2019-03-21

申请号：US15705584

申请日：2017-09-15

Applicant: Intel Corporation

Inventor： Mahan Movassaghi ,  Rohit Mittal ,  Robert W. Herrick ,  Jen-Chyun Chen

IPC: H01S3/00 ,  H01S3/10

Abstract: In embodiments, an apparatus to predict failure of a laser is presented. The apparatus may include a memory to store a reference model of bias current change for a laser as a function of time and temperature, one or more sensors to detect: temperature, elapsed operating time and bias current of the laser, and a processor communicatively coupled to the memory and to the one or more sensors. The processor may be to calculate an actual bias current change ΔIA at a current laser temperature, and an expected bias current change ΔIE, based at least in part on the reference model and an average operating temperature, subtract ΔIE from ΔIA, and if the difference is greater than a pre-defined value a, output a signal. Related methods and non-transitory computer-readable media may also be presented.