公开(公告)号：US20230083193A1

公开(公告)日：2023-03-16

申请号：US17348435

申请日：2021-06-15

Applicant: Intel Corporation

Inventor： Shen ZHOU ,  Xiaoming DU ,  Cong LI ,  Kuljit S. BAINS ,  Rajat AGARWAL ,  Murugasamy K. NACHIMUTHU ,  Maciej LAWNICZAK ,  Chao Yan TANG ,  Mariusz ORIOL

IPC: G06F11/07

Abstract: A system can predict memory device failure through identification of correctable error patterns based on the memory architecture. The failure prediction can thus account for the circuit-level of the memory rather than the mere number or frequency of correctable errors. A failure prediction engine correlates hardware configuration of the memory device with correctable errors (CEs) detected in data of the memory device to predict an uncorrectable error (UE) based on the correlation.

公开(公告)号：US20210279122A1

公开(公告)日：2021-09-09

申请号：US17317745

申请日：2021-05-11

Applicant: Intel Corporation

Inventor： Shen ZHOU ,  Cong LI ,  Kuljit S. BAINS ,  Xiaoming DU ,  Mariusz ORIOL

IPC: G06F11/07

Abstract: Methods and apparatus for lifetime telemetry on memory error statistics to improve memory failure analysis and prevention. Memory error information corresponding to detected correctable errors and uncorrectable memory errors are monitored, with the memory error information identifying an associated DRAM device in an associated DIMM. Corresponding micro-level error bits information from the memory error information is decoded and Micro-level Error Statistic Indicators (MESIs) are generated. Information associated with the MESIs from DRAM devices on the DIMMs are periodically written to persistent storage on those DIMMs. The MESIs for a given DIMM are updated over the lifetime of the DIMM.