公开(公告)号：US20170323186A1

公开(公告)日：2017-11-09

申请号：US15145998

申请日：2016-05-04

Applicant: International Business Machines Corporation

Inventor： Alberto VALDES GARCIA ,  Dirk PFEIFFER ,  Fengnian XIA

IPC: G06K19/02 ,  G06K19/06 ,  C30B25/02 ,  C23C16/26 ,  C30B23/02 ,  C23C16/56 ,  C30B33/00

CPC classification number: G06K19/02 ,  C23C16/26 ,  C23C16/56 ,  C30B23/02 ,  C30B25/02 ,  C30B33/00 ,  G06K19/06037 ,  G06K19/06046

Abstract: A system for labeling an object uses at least one object label made from a material that absorbs and reflects incident energy uniformly across all wavelengths of incident energy at a ratio proportional to a thickness of the material and that includes a pattern having variations in the thickness of the material along at least one of two orthogonal directions across the label. An interrogator directs a predetermined wavelength of radiation to the at least one label, and a reader to receives reflected radiation from the label at the predetermined wavelength and interprets the reflected radiation to recognize the pattern.

公开(公告)号：US20140327469A1

公开(公告)日：2014-11-06

申请号：US14028880

申请日：2013-09-17

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Dirk PFEIFFER ,  Jean-Olivier PLOUCHART ,  Peilin SONG

IPC: H03K19/003

CPC classification number: H03K19/003

Abstract: Methods, systems and devices related to authentication of chips using physical physical unclonable functions (PUFs) are disclosed. In accordance one such method, a test voltage is applied to a PUF system including a first subset of PUF elements that are arranged in series and a second subset of PUF elements that are arranged in series, where the first subset of PUF elements is arranged in parallel with respect to the second subset of PUF elements. In addition, the PUF system is measured to obtain at least one differential of states between the first subset of PUF elements and the second subset of PUF elements. Further, the method includes outputting an authentication sequence for the circuit that is based on the one or more differentials of states.

Abstract translation: 公开了使用物理不可克隆功能（PUF）的芯片认证相关的方法，系统和设备。 根据一种这样的方法，将测试电压施加到包括串联布置的PUF元件的第一子集和串联布置的PUF元件的第二子集的PUF系统，其中PUF元件的第一子集被布置在 相对于PUF元件的第二子集平行。 此外，测量PUF系统以获得PUF元素的第一子集和PUF元素的第二子集之间的状态的至少一个差异。 此外，该方法包括输出基于一个或多个状态差分的电路的认证序列。