公开(公告)号：US08642942B2

公开(公告)日：2014-02-04

申请号：US13851318

申请日：2013-03-27

Applicant: Intersil Americas Inc.

Inventor： Dong Zheng ,  Daryl Chamberlain

IPC: G01J1/44 ,  G02B5/32

CPC classification number: G01J1/44 ,  G01J1/4228 ,  G11B7/131 ,  G11B7/22

Abstract: A configurable photo detector circuit comprises a photo detector array including a plurality of photo detectors coupled to a plurality of amplifiers. A method for programming a detection pattern of the configurable photo detector circuit comprises selecting a first detection pattern for the photo detector array, generating first signals to create the first selected detection pattern, and applying the first generated signals to the photo detector circuit to implement the first selected detection pattern.

Abstract translation: 可配置的光电检测器电路包括光电检测器阵列，其包括耦合到多个放大器的多个光电检测器。 一种用于对可配置光电检测器电路的检测图案进行编程的方法包括选择用于光电检测器阵列的第一检测图案，产生第一信号以产生第一选择的检测图案，以及将第一生成信号施加到光电检测器电路，以实现 第一选择的检测模式。

公开(公告)号：US20130214133A1

公开(公告)日：2013-08-22

申请号：US13851318

申请日：2013-03-27

Applicant: Intersil Americas Inc.

Inventor： Dong Zheng ,  Daryl Chamberlain

IPC: G01J1/44

CPC classification number: G01J1/44 ,  G01J1/4228 ,  G11B7/131 ,  G11B7/22

Abstract: A configurable photo detector circuit comprises a photo detector array including a plurality of photo detectors coupled to a plurality of amplifiers. A method for programming a detection pattern of the configurable photo detector circuit comprises selecting a first detection pattern for the photo detector array, generating first signals to create the first selected detection pattern, and applying the first generated signals to the photo detector circuit to implement the first selected detection pattern.

Abstract translation: 可配置的光电检测器电路包括光电检测器阵列，其包括耦合到多个放大器的多个光电检测器。 一种用于对可配置光电检测器电路的检测图案进行编程的方法包括选择用于光电检测器阵列的第一检测图案，产生第一信号以产生第一选择的检测图案，以及将第一生成信号施加到光电检测器电路，以实现 第一选择的检测模式。

公开(公告)号：US20130107133A1

公开(公告)日：2013-05-02

申请号：US13717413

申请日：2012-12-17

Applicant: INTERSIL AMERICAS INC.

Inventor： Daryl Chamberlin ,  Dong Zheng

IPC: H04N5/74

CPC classification number: H04N5/74 ,  G03B21/14 ,  G03B21/28 ,  H04N9/3129 ,  H04N9/3194

Abstract: Embodiments of the present invention generally relate to circuits, systems and methods that can be used to detect light beam misalignment, so that compensation for such misalignment can be performed. In accordance with an embodiment, a circuit includes a photo-detector (PD) having a plurality of electrically isolated PD segments. Additionally, the circuit has circuitry, including switches, configured to control how currents indicative of light detected by the plurality of electrically isolated PD segments are arithmetically combined. When the switches are in a first configuration, a signal produced by the circuitry is indicative of vertical light beam alignment. When the switches are in a second configuration, the signal produced by the circuitry is indicative of horizontal light beam alignment. The signals indicative of vertical light beam alignment and horizontal light beam alignment can be used detect light beam misalignment, so that compensation for such misalignment can be performed.

Abstract translation: 本发明的实施例通常涉及可用于检测光束未对准的电路，系统和方法，从而可以执行对这种不对准的补偿。 根据实施例，电路包括具有多个电隔离PD段的光检测器（PD）。 另外，该电路具有包括开关的电路，其被配置为控制指示由多个电隔离的PD段检测到的光的电流如何被算术组合。 当开关处于第一配置时，由电路产生的信号指示垂直光束对准。 当开关处于第二配置时，由电路产生的信号指示水平光束对准。 可以使用指示垂直光束对准和水平光束对准的信号来检测光束未对准，从而可以执行对这种未对准的补偿。

公开(公告)号：US08425048B1

公开(公告)日：2013-04-23

申请号：US13717413

申请日：2012-12-17

Applicant: Intersil Americas Inc.

Inventor： Daryl Chamberlin ,  Dong Zheng

IPC: G03B21/14 ,  H04N3/22

CPC classification number: H04N5/74 ,  G03B21/14 ,  G03B21/28 ,  H04N9/3129 ,  H04N9/3194

Abstract: Embodiments of the present invention generally relate to circuits, systems and methods that can be used to detect light beam misalignment, so that compensation for such misalignment can be performed. In accordance with an embodiment, a circuit includes a photo-detector (PD) having a plurality of electrically isolated PD segments. Additionally, the circuit has circuitry, including switches, configured to control how currents indicative of light detected by the plurality of electrically isolated PD segments are arithmetically combined. When the switches are in a first configuration, a signal produced by the circuitry is indicative of vertical light beam alignment. When the switches are in a second configuration, the signal produced by the circuitry is indicative of horizontal light beam alignment. The signals indicative of vertical light beam alignment and horizontal light beam alignment can be used detect light beam misalignment, so that compensation for such misalignment can be performed.

Abstract translation: 本发明的实施例通常涉及可用于检测光束未对准的电路，系统和方法，从而可以执行对这种不对准的补偿。 根据实施例，电路包括具有多个电隔离PD段的光检测器（PD）。 另外，该电路具有包括开关的电路，其被配置为控制指示由多个电隔离的PD段检测到的光的电流如何被算术组合。 当开关处于第一配置时，由电路产生的信号指示垂直光束对准。 当开关处于第二配置时，由电路产生的信号指示水平光束对准。 可以使用指示垂直光束对准和水平光束对准的信号来检测光束未对准，从而可以执行对这种未对准的补偿。