HIGH PRECISION WAVELENGTH MEASUREMENT AND CONTROL OF A TUNABLE LASER

    公开(公告)号:US20180010967A1

    公开(公告)日:2018-01-11

    申请号:US15677146

    申请日:2017-08-15

    CPC classification number: G01J9/0246 H01S3/1303 H01S3/1305 H01S3/1307

    Abstract: A tunable laser system includes a tunable laser to be scanned over a range of frequencies and an interferometer having a plurality of interferometer outputs. At least two interferometer outputs of the plurality of interferometer outputs have a phase difference. A wavelength reference has a spectral feature within the range of frequencies, and the spectral feature does not change in an expected operating environment of the tunable laser. Processing circuitry uses the spectral feature and the plurality of interferometer outputs to produce an absolute measurement of a wavelength of the tunable laser and controls the tunable laser based on a comparison of the absolute measurement of the wavelength of the tunable laser with a setpoint wavelength.

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