PROOF MASS AND POLYSILICON ELECTRODE INTEGRATED THEREON

    公开(公告)号:US20190035905A1

    公开(公告)日:2019-01-31

    申请号:US16044233

    申请日:2018-07-24

    Abstract: A method includes depositing a silicon layer over a first oxide layer that overlays a first silicon substrate. The method further includes depositing a second oxide layer over the silicon layer to form a composite substrate. The composite substrate is bonded to a second silicon substrate to form a micro-electro-mechanical system (MEMS) substrate. Holes within the second silicon substrate are formed by reaching the second oxide layer of the composite substrate. The method further includes removing a portion of the second oxide layer through the holes to release MEMS features. The MEMS substrate may be bonded to a CMOS substrate.

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