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公开(公告)号:US20130043536A1
公开(公告)日:2013-02-21
申请号:US13214102
申请日:2011-08-19
申请人: Irfan RAHIM , Jeffrey T. WATT , Yanzhong XU , Lin-Shih LIU
发明人: Irfan RAHIM , Jeffrey T. WATT , Yanzhong XU , Lin-Shih LIU
IPC分类号: H01L27/12 , H01L21/336
CPC分类号: H01L29/7851 , H01L21/761 , H01L29/66795
摘要: One embodiment relates to a buffered transistor device. The device includes a buffered vertical fin-shaped structure formed in a semiconductor substrate. The vertical fin-shaped structure includes at least an upper semiconductor layer, a buffer region, and at least part of a well region. The buffer region has a first doping polarity, and the well region has a second doping polarity which is opposite to the first doping polarity. At least one p-n junction that at least partially covers a horizontal cross section of the vertical fin-shaped structure is formed between the buffer and well regions. Other embodiments, aspects, and features are also disclosed.
摘要翻译: 一个实施例涉及缓冲晶体管器件。 该器件包括形成在半导体衬底中的缓冲的垂直鳍状结构。 垂直鳍状结构至少包括上半导体层,缓冲区和阱区的至少一部分。 缓冲区具有第一掺杂极性,并且阱区具有与第一掺杂极性相反的第二掺杂极性。 在缓冲区和阱区之间形成至少部分覆盖垂直鳍状结构的水平横截面的至少一个p-n结。 还公开了其它实施例,方面和特征。