Virtual metering with partitioned metrology
    1.
    发明授权
    Virtual metering with partitioned metrology 有权
    虚拟计量与分区计量

    公开(公告)号:US09082291B2

    公开(公告)日:2015-07-14

    申请号:US13717406

    申请日:2012-12-17

    Applicant: Itron, Inc.

    Abstract: A distributed metering platform virtualizes functions of a conventional metrology sensor and separates the virtualized functions from a metrology sensor. One or more virtual meters or applications may be instantiated at a network communication device that is remote from the metrology sensor and processes metrology data received from the metrology sensor. Each virtual meter may include multiple partitioned application spaces that are isolated from one another. In one example, a first application space includes a locked version of code and a second application space includes an unlocked version of code. Furthermore, each virtual meter may be isolated from other virtual meters such that each virtual meter is unable to affect operations and/or data associated with other virtual meters.

    Abstract translation: 分布式计量平台虚拟化常规计量传感器的功能,并将虚拟化功能与计量传感器分离。 一个或多个虚拟仪表或应用可以在远离测量传感器的网络通信设备上实例化,并处理从计量传感器接收的计量数据。 每个虚拟仪表可以包括彼此隔离的多个分区应用空间。 在一个示例中,第一应用空间包括锁定版本的代码,并且第二应用空间包括解锁版本的代码。 此外,每个虚拟仪表可以与其他虚拟仪表隔离,使得每个虚拟仪表不能影响与其他虚拟仪表相关联的操作和/或数据。

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