公开(公告)号：US20030062463A1

公开(公告)日：2003-04-03

申请号：US10238627

申请日：2002-09-11

Applicant: JASCO CORPORATION

Inventor： Yoshihito Narita ,  Fuminori Sato ,  Tohru Sakamaki ,  Tsutomu Inoue ,  Shigeyuki Kimura ,  Norihito Hujiwara

IPC: G02B007/04

CPC classification number: G01J3/28 ,  G01Q60/22

Abstract: The object of the invention is to provide a near-field spectrometer that can efficiently obtain a true spectral information. The near-field spectrometer 10 comprises a Z-axis scanner 18, 20 for bringing a sample 24 and the tip of a probe 12 close to each other at a predetermined distance within a near-field 26 region when obtaining near-field spectral information and separating them from each other at a predetermined distance outside a near-field 26 region when obtaining back ground spectral information, and a data processor 22 for obtaining the true near-field spectral information free from the background by subtracting the background spectral information from the near-field spectral information, characterized in that a background information collector, during the separation of the sample 24 and the tip of the probe 12 at a predetermined distance outside the near-field 26 region, obtains the background spectral information for the corresponding portion to be measured.

Abstract translation: 本发明的目的是提供一种可以有效地获得真实光谱信息的近场光谱仪。 近场光谱仪10包括Z轴扫描器18,20，用于当获得近场光谱信息时，使样本24和探针12的尖端以近场26区域内的预定距离彼此靠近， 当获得背景光谱信息时，在近场26区域外的预定距离处彼此分离它们;以及数据处理器22，用于通过从近处获得背景光谱信息来从背景中获得没有背景的真实近场光谱信息 场地光谱信息，其特征在于，背景信息采集器在样品24和探针12的尖端在远场26区域外的预定距离分离期间获得用于相应部分的背景光谱信息 测量。

公开(公告)号：US20030039429A1

公开(公告)日：2003-02-27

申请号：US10192592

申请日：2002-07-11

Applicant: JASCO CORPORATION

Inventor： Tsutomu Inoue ,  Shigeyuki Kimura ,  Yoshihito Narita

IPC: G02B006/26 ,  G01N021/47

CPC classification number: G01Q60/22 ,  G02B6/241 ,  G02B6/245

Abstract: A scattering type near-field probe for use in a near-field optical apparatus, capable of freely controlling its probe shape, having a high lot-to-lot shape stability, and improving the lot-to-lot resonant frequency offset, is provided The probe of the invention comprises a glass fiber having at its extremity a core projecting portion coated with a metal. A method of manufacturing thereof comprises the steps of: forming the core projecting portion at an extremity of the glass fiber, by etching the extremity of the glass fiber using chemical etching process; and coating the core projecting portion with a metal.

Abstract translation: 提供了一种用于近场光学装置的散射型近场探头，其能够自由地控制其探针形状，具有高的批次形状稳定性，并且提高了批次间谐振频率偏移。 本发明的探针包括玻璃纤维，其末端具有被金属覆盖的芯突出部分。 其制造方法包括以下步骤：通过使用化学蚀刻工艺蚀刻玻璃纤维的末端，在玻璃纤维的末端形成芯突出部分; 并用金属涂覆芯突出部分。

公开(公告)号：US20020056807A1

公开(公告)日：2002-05-16

申请号：US09986012

申请日：2001-11-07

Applicant: JASCO CORPORATION

Inventor： Yoshihito Narita ,  Shigeyuki Kimura

IPC: H01J003/14 ,  H01J005/16

CPC classification number: G01Q60/22 ,  G01Q10/06 ,  G01Q30/06 ,  Y10S977/862

Abstract: A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity

Abstract translation: 一种近场显微镜，包括：用于散射近场光的探针; 发光器件包括用于向样品或所述探针发射光的光源; 以及用于采样和检测包括由所述探针散射的样品的信息的光的光取样装置，所述显微镜包括：用于将所述样品或探针与由所述发光产生的近场光的场间隔开的控制装置， 在近场光场中的浅的位置处的样品或探针，从而通过所述光采样装置检测噪声; 将所述样品或探针深深地插入由所述发光产生的近场光的场中，从而由所述光采样装置检测光强度; 以及用于计算通过从所述光强减去噪声而获得的测量结果的计算装置