公开(公告)号：US20180264590A1

公开(公告)日：2018-09-20

申请号：US15922889

申请日：2018-03-15

申请人： JENTEK Sensors, Inc.

发明人： Neil J. Goldfine ,  Zachary M. Thomas ,  Todd M. Dunford

IPC分类号： B23K26/042 ,  G01K13/00 ,  G01R19/00 ,  B22F3/105 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  B23K26/03 ,  B23K15/00

CPC分类号： B23K26/042 ,  B22F3/005 ,  B22F3/1055 ,  B22F2003/1056 ,  B22F2003/1057 ,  B22F2202/06 ,  B22F2203/03 ,  B22F2999/00 ,  B23K15/0086 ,  B23K15/0093 ,  B23K26/03 ,  B23K26/034 ,  B23K26/1224 ,  B23K26/123 ,  B23K26/342 ,  B23K2103/05 ,  B23K2103/14 ,  B23K2103/26 ,  B23K2103/52 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  G01K13/00 ,  G01K13/10 ,  G01R19/0046 ,  G05B2219/49036 ,  Y02P10/295

摘要： A sensor is provided near an additive manufacturing (AM) part during fabrication to provide information about the condition of the additive material during fabrication. Sensor measurements are used for in situ monitoring and control of the AM system. By placing a sensor at this location, information at or near this location may be collected and then analyzed to determine if the AM process is proceeding acceptably, or if real-time modifications to the process should be made to improve the performance of the process. Conditions monitored by the sensor may include the melt pool dimensions, the temperature ahead of and at the melt pool, properties of the powder bed such as temperature and particle size distribution, local powder conditions, prior layer condition, and applied layer condition behind the laser. A control system uses these monitored conditions to adjust and control the ongoing AM fabrication process.

公开(公告)号：US20230095662A1

公开(公告)日：2023-03-30

申请号：US17652993

申请日：2022-03-01

申请人： JENTEK Sensors, Inc.

发明人： Neil J. Goldfine ,  Andrew P. Washabaugh ,  Todd M. Dunford ,  Zachary M. Thomas

IPC分类号： G01N27/72 ,  B33Y50/00 ,  B29C64/386

摘要： Disclosed are method and apparatus for measuring material properties. Segmented field sensors have multiple sensing elements at different spatial geometries to capture field components having substantially different depths of penetration. These sensors are excited and measured on these different sensing elements to facilitate characterization of unknown material properties. This is illustrated in some embodiments using eddy current sensors to characterize materials that are frequency dispersive and/or do not produce a measurable phase shifts. Only a single scalar quantity may provide independent information from one or more of the sensing elements. Property estimation techniques, such as those using precomputed databases of sensor responses are used to estimate the unknown material properties.

公开(公告)号：US20220341875A1

公开(公告)日：2022-10-27

申请号：US17660979

申请日：2022-04-27

申请人： JENTEK Sensors, Inc.

发明人： Stuart Chaplan ,  Neil Goldfine ,  Zachary M. Thomas

IPC分类号： G01N27/9013

摘要： A system and method are provided for performing a hole inspection performance study. Specimens for the performance study are made from a reconfigurable set of inspection plates. Each plate includes multiple test holes which are located symmetrically. The plates may be of various thicknesses and materials. Each test hole may or may not have a feature such as a crack or machining notch. Such features may be located at various positions of the hole, such as at an edge, within the bore, and at various circumferential positions. A specimen is formed by stacking two or more plates and securing the stack together with an alignment tool. A variety of specimens may be formed by using different combinations of inspection plates and flipping and rotating the member plates. A hole inspection system is disclosed as well as an inspection procedure and data processing algorithm for inspecting each hole.

公开(公告)号：US20190383771A1

公开(公告)日：2019-12-19

申请号：US16445166

申请日：2019-06-18

申请人： JENTEK Sensors, Inc.

发明人： Neil J. Goldfine ,  Andrew P. Washabaugh ,  Todd M. Dunford ,  Zachary M. Thomas

IPC分类号： G01N27/72 ,  B33Y50/00 ,  B29C64/386

摘要： Disclosed are method and apparatus for measuring material properties. Segmented field sensors have multiple sensing elements at different spatial geometries to capture field components having substantially different depths of penetration. These sensors are excited and measured on these different sensing elements to facilitate characterization of unknown material properties. This is illustrated in some embodiments using eddy current sensors to characterize materials that are frequency dispersive and/or do not produce a measurable phase shifts. Only a single scalar quantity may provide independent information from one or more of the sensing elements. Property estimation techniques, such as those using precomputed databases of sensor responses are used to estimate the unknown material properties.