Charged Particle Beam Apparatus
    1.
    发明公开

    公开(公告)号:US20230274910A1

    公开(公告)日:2023-08-31

    申请号:US18112687

    申请日:2023-02-22

    Applicant: JEOL Ltd.

    Abstract: Light which is radiant energy is emitted from a sample which is heated, and is detected by a backscattered electron detector. A detection signal from the backscattered electron detector includes a radiant component. A radiant component removal section extracts the radiant component from the detection signal using a filter, and then removes the radiant component from the detection signal. An optical detector which detects the radiant component may be provided. A divided detector may be provided as the backscattered electron detector.

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