公开(公告)号：US4229652A

公开(公告)日：1980-10-21

申请号：US911974

申请日：1978-06-02

申请人： Jacques Weinstock ,  Derek Lieber ,  William D. Hay

发明人： Jacques Weinstock ,  Derek Lieber ,  William D. Hay

IPC分类号： G01B15/02 ,  G01N23/203 ,  G01Q10/00 ,  G01Q60/16 ,  G01N23/00

CPC分类号： G01B15/02 ,  G01N23/203

摘要： A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mouted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.

摘要翻译： 一种后向散射测量装置，用于测量基板材料条上的涂层的厚度，其以预定速度从进给供给位置移动到卷取位置。 测量轮设置在其边缘上，是用于照射和检测来自涂覆的基底的反向散射辐射的向后散射探测器。 涂覆的基材材料带围绕边缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动条的速度，由此探针和条带上的相邻点相对于彼此是固定的，而带上的点相邻 边缘 因此，可以在不停止涂覆的条的移动的情况下进行厚度测量。

公开(公告)号：US4190770A

公开(公告)日：1980-02-26

申请号：US851735

申请日：1977-11-15

申请人： James Saunders ,  William D. Hay ,  Jacques Weinstock ,  Derek Lieber

发明人： James Saunders ,  William D. Hay ,  Jacques Weinstock ,  Derek Lieber

IPC分类号： G01Q60/22 ,  G01B15/02 ,  G01N23/00

CPC分类号： G01B15/02

摘要： A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.

摘要翻译： 一种反向散射测量装置，用于测量以预定速度从形成从供料供给到卷取位置的衬底材料幅材的元件上的涂层的厚度。 提供了测量轮，邻近其边缘安装有用于照射和检测来自涂覆基底的反向散射辐射的后向散射探针。 衬底材料的网围绕轮缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动幅材的速度，由此探针和幅材上的相邻点相对于彼此是固定的，而幅材上的点相邻 边缘 因此，可以在不停止涂布的网的移动的情况下进行厚度测量。 该反向散射测量装置还设置有分度装置，用于将探针自动定位在幅材上待测量的元件上。

公开(公告)号：US4115690A

公开(公告)日：1978-09-19

申请号：US803250

申请日：1977-06-03

申请人： Jacques Weinstock ,  Derek Lieber ,  William Dunning Hay

发明人： Jacques Weinstock ,  Derek Lieber ,  William Dunning Hay

IPC分类号： G01Q60/22 ,  G01B15/02 ,  G01N23/203 ,  G01N23/00

CPC分类号： G01B15/02

摘要： A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.

摘要翻译： 一种后向散射测量装置，用于测量基板材料条上的涂层的厚度，其以预定速度从进给供给位置移动到卷取位置。 测量轮设置在其边缘上，其安装有后向散射探针，用于照射和检测来自涂覆的基底的背向散射的辐射。 涂覆的基材材料带围绕边缘的外表面旋拧。 测量轮以一定速度旋转，使得边缘上的点的切线速度等于移动条的速度，由此探针和条带上的相邻点相对于彼此是固定的，而条带上的点相邻 边缘 因此，可以在不停止涂覆的条的移动的情况下进行厚度测量。

公开(公告)号：US4437000A

公开(公告)日：1984-03-13

申请号：US245936

申请日：1981-03-20

申请人： Jacques Weinstock

发明人： Jacques Weinstock

IPC分类号： G01N23/203 ,  G01Q90/00 ,  G01N23/00 ,  G01D18/00

CPC分类号： G01N23/203

摘要： An aperture piece to be used in conjunction with backscatter instruments for measuring the thickness of a coating on a substrate of a concave workpiece. The aperture piece being selectively shaped so that a sample support surface, including an aperture through which radiation from a radioisotope is transmitted, may be inserted into the interior space defined by the concave workpiece to engage the concave surface. A method of calibrating backscatter instruments using the aperture piece to make correction for the failure to have a planar mating relation between the sample support surface and the concave workpiece.

摘要翻译： 与后向散射仪器结合使用的孔径片，用于测量凹形工件的基底上的涂层的厚度。 该孔片被选择性地成形为使得包括从放射性同位素辐射的孔的样品支撑表面可被插入到由凹形工件限定的内部空间中以接合凹面。 使用孔径片校准后向散射仪器的方法来校正不能在样品支撑表面和凹入工件之间具有平面配合关系。