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42 条记录 (耗时 0.031 秒)

    SYSTEM AND METHOD OF ELIMINATING IMAGE ARTIFACTS
    6.
    发明申请
    SYSTEM AND METHOD OF ELIMINATING IMAGE ARTIFACTS 有权
    消除影像艺术的系统和方法

    公开(公告)号：US20110139993A1

    公开(公告)日：2011-06-16

    申请号：US12637069

    申请日：2009-12-14

    申请人： James Zhengshe Liu ,  Feng Gao ,  Kenneth Scott Kump

    发明人： James Zhengshe Liu ,  Feng Gao ,  Kenneth Scott Kump

    IPC分类号： G01T1/24

    CPC分类号： H04N5/32 ,  A61B6/508 ,  A61B6/5258 ,  H04N5/3577

    摘要： A system and method for eliminating image artifacts caused by electromagnetic interference (EMI) on a digital x-ray detector. The system and method includes a digital x-ray detector panel having an array of pixels in rows and columns, with a plurality of data lines coupled to the columns of pixels and a plurality of scan lines coupled to the rows of pixels. The system and method uses certain photodiodes in a row of the pixel array for measuring EMI with corresponding scan line and FETs deactivated and eliminating the EMI and image artifacts with the remaining photodiodes in the row with corresponding scan line and FETs activated.

    摘要翻译： 一种用于消除由数字X射线检测器上的电磁干扰（EMI）引起的图像伪影的系统和方法。 该系统和方法包括数字X射线检测器面板，其具有行和列中的像素阵列，多个数据线耦合到像素列，以及耦合到像素行的多条扫描线。 该系统和方法使用像素阵列的一行中的某些光电二极管来测量具有相应扫描线的EMI，并且FET被去激活，并且消除了具有相应扫描线和FET的行中剩余的光电二极管的EMI和图像伪影。

    Artifact reduction system and method for radiological imaging system
    8.
    发明授权
    Artifact reduction system and method for radiological imaging system 失效
    放射成像系统的神器减少系统和方法

    公开(公告)号：US07649979B2

    公开(公告)日：2010-01-19

    申请号：US12124355

    申请日：2008-05-21

    申请人： James Zhengshe Liu ,  Tiantian Zhang ,  Kenneth Scott Kump ,  Jingyi Liang ,  Chuande Liu ,  Kadri Nizar Jabri

    发明人： James Zhengshe Liu ,  Tiantian Zhang ,  Kenneth Scott Kump ,  Jingyi Liang ,  Chuande Liu ,  Kadri Nizar Jabri

    IPC分类号： H05G1/64

    CPC分类号： H04N5/32 ,  H04N5/3577

    摘要： The effects of electromagnetic interference (EMI) on X-ray image data is corrected by characterizing the EMI and processing the image data to subtract the EMI effects from the image data. The X-ray image data, along with offset data, are collected in a conventional manner, affected by EMI if present, and EMI-characterizing data is immediately collected thereafter by disabling rows of a digital detector (FET off). The EMI-characterizing data, then, is not affected by the presence of image data, and can be used to characterize the amplitude and frequency of the EMI. The EMI-characterizing data is assured of being in phase with the collected image and offset data due to its collection in the same image acquisition sequence immediately following the collection of image and offset data. Artifacts due to the presence of EMI are thus eliminated from reconstructed images based upon the corrected data.

    摘要翻译： 电磁干扰（EMI）对X射线图像数据的影响通过表征EMI和处理图像数据来校正，以从图像数据中减去EMI效应。 X射线图像数据以及偏移数据以常规方式收集，受EMI影响（如果存在），并且EMI特征数据立即收集，此后通过禁用数字检测器（FET关闭）的行。 EMI表征数据然后不受图像数据的存在的影响，并且可以用于表征EMI的幅度和频率。 EMI特征数据被确保与收集的图像和偏移数据同步，这是由于其在收集图像和偏移数据之后的相同图像采集序列中的收集。 因此，由于存在EMI的人为因素基于校正数据而从重构图像中消除。

    X-ray system and method for sampling image data
    9.
    发明授权
    X-ray system and method for sampling image data 有权
    X射线系统和图像数据采样方法

    公开(公告)号：US08576986B2

    公开(公告)日：2013-11-05

    申请号：US13011033

    申请日：2011-01-21

    申请人： James Zhengshe Liu ,  Paul Richard Granfors ,  Kenneth Scott Kump ,  Ping Xue ,  Donald Fayette Langler ,  Brian John Kost

    发明人： James Zhengshe Liu ,  Paul Richard Granfors ,  Kenneth Scott Kump ,  Ping Xue ,  Donald Fayette Langler ,  Brian John Kost

    IPC分类号： H05G1/64 ,  H05G1/46 ,  G01T1/20

    CPC分类号： G01T1/247 ,  A61B6/4494 ,  G01T1/24

    摘要： An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image data by sampling data from the discrete picture elements while applying a second voltage to the transistors of the discrete picture elements not then being sampled, the second voltage being more negative than the first voltage. The method further includes receiving X-ray radiation on the detector from a source. The method yet further includes sampling X-ray image data from the discrete picture elements while applying the second voltage to the transistors of the discrete picture elements not then being sampled.

    摘要翻译： 一种X射线成像方法包括：数字X射线检测器，包括各自包括光电二极管和晶体管的离散像素阵列，向离散像素的晶体管施加第一电压。 该方法还包括准备通过从离散像素采样数据来获取X射线图像数据，同时向未被采样的离散像素的晶体管施加第二电压，第二电压比第一电压更负。 该方法还包括从源接收检测器上的X射线辐射。 该方法还包括从离散像素采样X射线图像数据，同时将第二电压施加到未被采样的离散像素的晶体管。

    X-RAY SYSTEM AND METHOD FOR SAMPLING IMAGE DATA
    10.
    发明申请
    X-RAY SYSTEM AND METHOD FOR SAMPLING IMAGE DATA 有权
    X射线系统和采样图像数据的方法

    公开(公告)号：US20120189100A1

    公开(公告)日：2012-07-26

    申请号：US13011033

    申请日：2011-01-21

    申请人： James Zhengshe Liu ,  Paul Richard Granfors ,  Kenneth Scott Kump ,  Ping Xue ,  Donald Fayette Langler ,  Brian John Kost

    发明人： James Zhengshe Liu ,  Paul Richard Granfors ,  Kenneth Scott Kump ,  Ping Xue ,  Donald Fayette Langler ,  Brian John Kost

    IPC分类号： G01N23/04

    CPC分类号： G01T1/247 ,  A61B6/4494 ,  G01T1/24

    摘要： An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image data by sampling data from the discrete picture elements while applying a second voltage to the transistors of the discrete picture elements not then being sampled, the second voltage being more negative than the first voltage. The method further includes receiving X-ray radiation on the detector from a source. The method yet further includes sampling X-ray image data from the discrete picture elements while applying the second voltage to the transistors of the discrete picture elements not then being sampled.

    摘要翻译： 一种X射线成像方法包括：数字X射线检测器，包括各自包括光电二极管和晶体管的离散像素阵列，向离散像素的晶体管施加第一电压。 该方法还包括准备通过从离散像素采样数据来获取X射线图像数据，同时向未被采样的离散像素的晶体管施加第二电压，第二电压比第一电压更负。 该方法还包括从源接收检测器上的X射线辐射。 该方法还包括从离散像素采样X射线图像数据，同时将第二电压施加到未被采样的离散像素的晶体管。