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公开(公告)号：US07708446B2
公开(公告)日：2010-05-04
申请号：US12037386
申请日：2008-02-26
IPC分类号： F21V7/04
CPC分类号： G02F1/133606 , G02F2001/133607
摘要： Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.
摘要翻译： 这里公开了一种用于背光显示系统的显示膜堆叠。 在一个实施例中，显示系统包括：光源，包括由第一折射率的第一材料形成的第一表面纹理层的第一膜和包括第二表面纹理层的第二膜，所述第二表面纹理层由 第二折射率材料。 第二膜设置在光源和第一膜之间。 第二折射率大于第一折射率。 光源设置成与第一膜和第二膜光学连通。 第一表面纹理层和第二表面纹理层包括独立地选自半球形结构，部分半球形结构，椭圆形结构，浸没的球形珠，椭圆形珠，“钟形”凸块和复合透镜形状结构中的单元结构。
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公开(公告)号：US20090219461A1
公开(公告)日：2009-09-03
申请号：US12037386
申请日：2008-02-26
IPC分类号： G02F1/13357 , F21V5/00 , G09F13/04
CPC分类号： G02F1/133606 , G02F2001/133607
摘要： Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.
摘要翻译： 这里公开了一种用于背光显示系统的显示膜堆叠。 在一个实施例中，显示系统包括：光源，包括由第一折射率的第一材料形成的第一表面纹理层的第一膜和包括第二表面纹理层的第二膜，所述第二表面纹理层由 第二折射率材料。 第二膜设置在光源和第一膜之间。 第二折射率大于第一折射率。 光源设置成与第一膜和第二膜光学连通。 第一表面纹理层和第二表面纹理层包括独立地选自半球形结构，部分半球形结构，椭圆形结构，浸没的球形珠，椭圆形珠，“钟形”凸块和复合透镜形状结构中的单元结构。
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公开(公告)号：US07371590B2
公开(公告)日：2008-05-13
申请号：US11285331
申请日：2005-11-21
申请人： Kevin Patrick Capaldo , Mark Allen Cheverton , Dennis Joseph Coyle , Michael John Davis , Sameer Kirti Talsania , Masako Yamada , Chung-hei Yeung
发明人： Kevin Patrick Capaldo , Mark Allen Cheverton , Dennis Joseph Coyle , Michael John Davis , Sameer Kirti Talsania , Masako Yamada , Chung-hei Yeung
IPC分类号： H01L21/66
CPC分类号： G01N21/95 , G01N21/8422 , G01N21/8806
摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.
摘要翻译： 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。
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4.发明授权Method of air-flow measurement and active operating limit line management for compressor surge avoidance 有权空气流量测量方法和压缩机浪涌回避的主动运行限制线路管理公开(公告)号：US06364602B1
公开(公告)日：2002-04-02
申请号：US09478523
申请日：2000-01-06
IPC分类号： F04D1714
CPC分类号： F01D25/007 , F01D21/10 , F02C7/30 , F02C9/28 , F04D27/02
摘要： A transfer function between the inlet air-flow consumed by a Gas Turbine engine, and the engine parameters of speed, pressure ratio, and Inlet Guide Vane (IGV) angle is described. An active compressor Operating Limit Line (OLL) management strategy that leverages this improved flow measurement transfer function is also described. The improved flow measurement capability afforded by the transfer function permits a deterioration in flow rate caused by compressor fouling to be detected. Using the deterioration in flow rate as a proxy for compressor fouling, a degraded surge boundary associated with fouling can be predicted, using a transfer function between degradation of air-flow along operating line and degradation of surge line. In combination, the inventive improvements in flow measurement and operating line management afford added compressor surge protection across the operating range, while permitting the attainment of elevated pressure ratios associated with high thermodynamic efficiency and output.
摘要翻译： 描述了燃气轮机发动机消耗的入口气流与速度，压力比和进气导叶（IGV）角度的发动机参数之间的传递函数。 还描述了利用这种改进的流量测量传递功能的主动压缩机操作限制线（OLL）管理策略。 通过传递函数提供的改进的流量测量能力允许检测到由压缩机污垢引起的流量的劣化。 使用流量的劣化作为压缩机污染的代理，可以使用在沿着操作线的气流的劣化和喘振线的劣化之间的传递函数来预测与结垢相关的劣化的浪涌边界。 结合起来，本发明的流量测量和操作管线管理的改进在整个操作范围内提供了增加的压缩机喘振保护，同时允许获得与高热力学效率和输出相关联的升高的压力比。
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公开(公告)号：US20070117225A1
公开(公告)日：2007-05-24
申请号：US11285331
申请日：2005-11-21
申请人： Kevin Capaldo , Mark Cheverton , Dennis Coyle , Michael Davis , Sameer Talsania , Masako Yamada , Chung-hei Yeung
发明人： Kevin Capaldo , Mark Cheverton , Dennis Coyle , Michael Davis , Sameer Talsania , Masako Yamada , Chung-hei Yeung
IPC分类号： H01L21/66
CPC分类号： G01N21/95 , G01N21/8422 , G01N21/8806
摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.
摘要翻译： 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。
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