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公开(公告)号：US20200018594A1
公开(公告)日：2020-01-16
申请号：US16034003
申请日：2018-07-12
申请人： Jinchi Zhang , Nicolas Badeau
发明人： Jinchi Zhang , Nicolas Badeau
摘要： Disclosed is a system and method for ultrasonic measurement of the average diameter and surface profile of a tube. A calibration block is used to calibrate the average tube diameter, and a correction is applied to account for any temperature difference of the couplant between calibration and test measurements. By using a linear probe, or a single probe with a finely pitched helicoidal scan, errors in diameter measurement due to presence of surface pits may be compensated.
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公开(公告)号：US20170336366A1
公开(公告)日：2017-11-23
申请号：US15602419
申请日：2017-05-23
申请人： Nicolas Badeau , Jason Habermehl
发明人： Nicolas Badeau , Jason Habermehl
摘要： Disclosed is an ultrasonic inspection probe assembly comprising a water wedge and a flexible probe array assembly having a flexible acoustic module. The wedge is machined to match a test surface to be inspected and is configured to shape the acoustic module so that the active surface of the acoustic module is parallel to the test surface. Different wedges may be machined to match different test surfaces, but the same flexible probe array assembly may be used for all such surfaces.
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公开(公告)号：US20230003691A1
公开(公告)日：2023-01-05
申请号：US17930464
申请日：2022-09-08
摘要： Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving a plurality of scan plan parameters associated with generating an image of at least one flaw within a specimen based on acoustic echo data obtained using full matrix capture (FMC); applying the plurality of scan plan parameters to an acoustic model, the acoustic model configured to determine a two-way pressure response of a plurality of inspection modes based on specular reflection and diffraction phenomena; generating, by the acoustic model based on the plurality of scan plan parameters, an acoustic region of influence (AROI) comprising an acoustic amplitude sensitivity map for a first inspection mode amongst the plurality of inspection modes; and generating, for display, a first image comprising the AROI associated with the first inspection mode for capturing or inspecting the image of the at least one flaw.
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公开(公告)号：US10578589B2
公开(公告)日：2020-03-03
申请号：US15994528
申请日：2018-05-31
摘要： Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.
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公开(公告)号：US10564131B2
公开(公告)日：2020-02-18
申请号：US15602419
申请日：2017-05-23
申请人： Nicolas Badeau , Jason Habermehl
发明人： Nicolas Badeau , Jason Habermehl
摘要： Disclosed is an ultrasonic inspection probe assembly comprising a water wedge and a flexible probe array assembly having a flexible acoustic module. The wedge is machined to match a test surface to be inspected and is configured to shape the acoustic module so that the active surface of the acoustic module is parallel to the test surface. Different wedges may be machined to match different test surfaces, but the same flexible probe array assembly may be used for all such surfaces.
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公开(公告)号：US20180348170A1
公开(公告)日：2018-12-06
申请号：US15994528
申请日：2018-05-31
CPC分类号： G01N29/262 , G01N29/043 , G01N29/069 , G01N29/07 , G01N29/4436 , G01N29/4463 , G01N2291/011 , G01N2291/044 , G01N2291/106
摘要： Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.
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