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1.发明申请公开(公告)号：US20190025155A1
公开(公告)日：2019-01-24
申请号：US16144277
申请日：2018-09-27
发明人： John E. Greivenkamp, JR. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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公开(公告)号：US20180252615A1
公开(公告)日：2018-09-06
申请号：US15952354
申请日：2018-04-13
发明人： John E. Greivenkamp, JR. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
CPC分类号： G01M11/025 , G01B9/02038 , G01B9/0209 , G01M11/0214 , G01M11/0271
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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3.发明申请公开(公告)号：US20190219477A1
公开(公告)日：2019-07-18
申请号：US16367778
申请日：2019-03-28
发明人： John E. Greivenkamp, JR. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
CPC分类号： G01M11/025 , G01B9/02038 , G01B9/0209 , G01M11/0214 , G01M11/0271
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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公开(公告)号：US10288522B2
公开(公告)日：2019-05-14
申请号：US16144277
申请日：2018-09-27
发明人： John E. Greivenkamp, Jr. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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公开(公告)号：US20160054195A1
公开(公告)日：2016-02-25
申请号：US14830076
申请日：2015-08-19
发明人： John E. Greivenkamp, Jr. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
CPC分类号： G01M11/025 , G01B9/02038 , G01B9/0209 , G01M11/0214 , G01M11/0271
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
摘要翻译： 制作的系统和方法用于对眼科应用进行干涉测量。 该系统利用低相干干涉仪获得接触透镜的多个测量结果。 该系统和方法表征了隐形眼镜两个表面的表面轮廓，厚度分布，并将这些测量结合索引信息来重建隐形眼镜的完整模型。
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公开(公告)号：US10416039B2
公开(公告)日：2019-09-17
申请号：US16367778
申请日：2019-03-28
发明人： John E. Greivenkamp, Jr. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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7.发明授权公开(公告)号：US10145757B2
公开(公告)日：2018-12-04
申请号：US15952354
申请日：2018-04-13
发明人： John E. Greivenkamp, Jr. , James William Haywood , Kyle C. Heideman , Russell T. Spaulding , Gregory Allen Williby
摘要： The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
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