公开(公告)号：US07132846B2

公开(公告)日：2006-11-07

申请号：US10665576

申请日：2003-09-22

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00

CPC分类号： G09G3/006

摘要： A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

摘要翻译： 提供了一种用于检查液晶显示基板的电气缺陷性的方法和装置。 该方法包括用导电短路棒短路ESD保护装置，以在基板的每个信号布线上形成电流路径，向信号布线提供电流，以及根据在信号上流动的电流来确定信号布线的缺陷 布线。

公开(公告)号：US07301360B2

公开(公告)日：2007-11-27

申请号：US10669348

申请日：2003-09-25

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00

CPC分类号： G09G3/006 ,  G01R31/315 ,  G09G3/3648 ,  G09G2300/0426

摘要： A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

摘要翻译： 一种新颖的方法和装置检查液晶显示器。 用于检查平板显示装置的方法和装置通过使用磁传感器扫描至少一根信号线，并检测磁传感器的电阻变化以感知信号线中的短路。 可以使用配置为阵列中的每个传感器小于像素的磁性传感器阵列来测试像素。

公开(公告)号：US07525336B2

公开(公告)日：2009-04-28

申请号：US12034422

申请日：2008-02-20

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00 ,  G02F1/133

CPC分类号： G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

摘要翻译： 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07009405B2

公开(公告)日：2006-03-07

申请号：US10670373

申请日：2003-09-26

申请人： Sung Joon Bae ,  Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Sung Joon Bae ,  Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/28 ,  G01R31/26

CPC分类号： G09G3/006 ,  G01R31/315

摘要： A method and apparatus tests a flat display device to inspect for shorts and open circuits in a signal wire by using a magnetic sensor. The inspection method and apparatus scans the magnetic sensor along signal wires in a scan direction crossing multiple signal wires and detects at least one of a short or an open circuit in the signal wires based on current detected by the magnetic sensor.

摘要翻译： 方法和装置通过使用磁传感器来测试平面显示装置来检查信号线中的短路和开路。 检查方法和装置沿着沿多个信号线的扫描方向的信号线扫描磁传感器，并且基于由磁传感器检测到的电流来检测信号线中的短路或开路中的至少一个。

公开(公告)号：US20080136440A1

公开(公告)日：2008-06-12

申请号：US12034422

申请日：2008-02-20

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/28 ,  G02F1/133

CPC分类号： G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

摘要翻译： 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07362124B2

公开(公告)日：2008-04-22

申请号：US11541577

申请日：2006-10-03

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00

CPC分类号： G09G3/006

摘要： A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

摘要翻译： 提供了一种用于检查液晶显示基板的电气缺陷性的方法和装置。 该方法包括用导电短路棒短路ESD保护装置，以在基板的每个信号布线上形成电流路径，向信号布线提供电流，以及根据在信号上流动的电流来确定信号布线的缺陷 布线。

公开(公告)号：US07358756B2

公开(公告)日：2008-04-15

申请号：US11391569

申请日：2006-03-29

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00

CPC分类号： G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

摘要翻译： 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07046030B2

公开(公告)日：2006-05-16

申请号：US10669460

申请日：2003-09-25

申请人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

发明人： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC分类号： G01R31/00

CPC分类号： G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.

摘要翻译： 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供衬底以检查其中衬底包括形成在衬底的有效显示区域中的信号布线，驱动开关和电容器; 将光照射到检查开关装置上，从而通过信号布线将检查线路的检查电压提供给驱动开关之一，从而对电容器之一充电; 以及通过读取电容器的充电电压来确定衬底的有效显示区域中是否存在缺陷。

公开(公告)号：US07625770B2

公开(公告)日：2009-12-01

申请号：US12320131

申请日：2009-01-16

申请人： Hyun Kyu Lee ,  See Hwa Jeong ,  Seung Chan Choi

发明人： Hyun Kyu Lee ,  See Hwa Jeong ,  Seung Chan Choi

IPC分类号： H01L21/00

CPC分类号： G02F1/134363

摘要： A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.

摘要翻译： 公开了一种用于提高开口率的液晶显示器及其制造方法。 根据本发明的液晶显示器（LCD）包括在薄膜晶体管阵列基板上的栅极线，数据线和公共线，栅极线与数据线交叉以限定像素区域; 靠近栅极线和数据线交叉的薄膜晶体管; 连接到像素区域中的公共线的公共电极; 以及像素电极，连接到所述像素区域中的所述薄膜晶体管，用于在所述LCD的操作期间与所述公共电极相关联地形成平面内电场，其中所述像素电极的边缘与所述公共线重叠至少一个 绝缘层之间，并且所述公共电极的边缘与所述至少一个绝缘层与所述像素电极重叠。

公开(公告)号：US20090137077A1

公开(公告)日：2009-05-28

申请号：US12320131

申请日：2009-01-16

申请人： Hyun Kyu Lee ,  See Hwa Jeong ,  Seung Chan Choi

发明人： Hyun Kyu Lee ,  See Hwa Jeong ,  Seung Chan Choi

IPC分类号： H01L21/02

CPC分类号： G02F1/134363

摘要： A liquid crystal display and a fabricating method thereof for improving an aperture ratio are disclosed. A liquid crystal display (LCD) according to the present invention includes a gate line, a data line and a common line on the thin film transistor array substrate, the gate line crossing the data line to define a pixel region; a thin film transistor near the crossing of the gate line and the data line; a common electrode connected to the common line in the pixel region; and a pixel electrode connected to the thin film transistor in the pixel area for forming an in-plane electric field in association with the common electrode during an operation of the LCD, wherein an edge of the pixel electrode overlaps the common line with at least one insulating layer therebetween, and an edge of the common electrode overlaps the pixel electrode with said at least one insulating layer therebetween.