System and method for automatically creating and transmitting test conditions of integrated circuit devices
    2.
    发明授权
    System and method for automatically creating and transmitting test conditions of integrated circuit devices 失效
    用于自动创建和传输集成电路设备测试条件的系统和方法

    公开(公告)号:US06236952B1

    公开(公告)日:2001-05-22

    申请号:US09106853

    申请日:1998-06-30

    IPC分类号: G01R3101

    CPC分类号: G01R31/2834

    摘要: Production information for ASIC (Application Specific Integrated Circuit) devices is stored in a database of a remote host system, and data necessary for a test program which controls testers for testing the IC devices are automatically created and transmitted to a tester host. This automatic system collects the data necessary for the test condition from the remote host database; creates the test condition by comparing the collected data with a predetermined handling condition; transmits the test condition to a tester host which controls a plurality of testers using corresponding test programs; and loads the test condition into the corresponding test program. This system avoids human errors which often result when test engineers write test conditions manually, and also allows quick response to a situation when new specific IC devices are required by a customer.

    摘要翻译: ASIC(专用集成电路)设备的生产信息存储在远程主机系统的数据库中,并且自动创建用于控制测试器测试IC器件的测试程序所需的数据并发送给测试者主机。 该自动系统从远程主机数据库收集测试条件所需的数据; 通过将收集的数据与预定的处理条件进行比较来创建测试条件; 将测试条件发送到使用相应的测试程序来控制多个测试者的测试者主机; 并将测试条件加载到相应的测试程序中。 该系统避免了测试工程师手动编写测试条件时经常产生的人为错误,并且还可以快速响应客户需要新的特定IC器件时的情况。