公开(公告)号：US07042401B2

公开(公告)日：2006-05-09

申请号：US11024568

申请日：2004-12-28

申请人： Jong-Kweon Park ,  Bong-Hyuk Park ,  Seung-Sik Lee ,  Jae-Young Kim ,  Sangsung Choi ,  Seoung-Hun Lee ,  Jung-Nam Lee

发明人： Jong-Kweon Park ,  Bong-Hyuk Park ,  Seung-Sik Lee ,  Jae-Young Kim ,  Sangsung Choi ,  Seoung-Hun Lee ,  Jung-Nam Lee

IPC分类号： H01Q1/38

CPC分类号： H01Q1/38

摘要： A micro-miniature, light weighted and low cost trapezoid ultra wide antenna having an ultra wide band characteristics and a notch characteristic in 5 GHz WLAN band (5.15–5.35 GHz) is disclosed. The trapezoid ultra wide antenna includes: a dielectric substrate; a trapezoid shaped patch formed at an upper end of a middle line on an upper side of the dielectric substrate; a feeding line formed at a bottom end of the middle line on the upper side of the dielectric substrate for feeding electric power to the trapezoid shaped patch; a matching stub formed between the trapezoid shaped patch and the feeding line for impedance matching between the trapezoid shaped patch and the feeding line; and a ground formed at a side of the feeding line on the upper side of the dielectric substrate.

摘要翻译： 公开了一种具有超宽带特性和5GHz WLAN频带（5.15-5.35GHz）中的陷波特性的微型，轻量级和低成本梯形超宽天线。 梯形超宽天线包括：电介质基片; 形成在电介质基板的上侧的中间线的上端的梯形贴片; 馈电线，形成在电介质基板的上侧的中间线的底端，用于将电力馈送到梯形贴片; 在梯形贴片和用于梯形贴片和馈线之间的阻抗匹配的馈线之间形成的匹配短截线; 以及在电介质基板的上侧的馈电线的一侧形成的接地。

公开(公告)号：US20060066487A1

公开(公告)日：2006-03-30

申请号：US11024568

申请日：2004-12-28

申请人： Jong-Kweon Park ,  Bong-Hyuk Park ,  Seung-Sik Lee ,  Jae-Young Kim ,  Sangsung Choi ,  Seoung-Hun Lee ,  Jung-Nam Lee

发明人： Jong-Kweon Park ,  Bong-Hyuk Park ,  Seung-Sik Lee ,  Jae-Young Kim ,  Sangsung Choi ,  Seoung-Hun Lee ,  Jung-Nam Lee

IPC分类号： H01Q1/38

CPC分类号： H01Q1/38

摘要： A micro-miniature, light weighted and low cost trapezoid ultra wide antenna having an ultra wide band characteristics and a notch characteristic in 5 GHz WLAN band (5.15-5.35 GHz) is disclosed. The trapezoid ultra wide antenna includes: a dielectric substrate; a trapezoid shaped patch formed at an upper end of a middle line on an upper side of the dielectric substrate; a feeding line formed at a bottom end of the middle line on the upper side of the dielectric substrate for feeding electric power to the trapezoid shaped patch; a matching stub formed between the trapezoid shaped patch and the feeding line for impedance matching between the trapezoid shaped patch and the feeding line; and a ground formed at a side of the feeding line on the upper side of the dielectric substrate.

摘要翻译： 公开了一种具有超宽带特性和5GHz WLAN频带（5.15-5.35GHz）中的陷波特性的微型，轻量级和低成本梯形超宽天线。 梯形超宽天线包括：电介质基片; 形成在电介质基板的上侧的中间线的上端的梯形贴片; 馈电线，形成在电介质基板的上侧的中间线的底端，用于将电力馈送到梯形贴片; 在梯形贴片和用于梯形贴片和馈线之间的阻抗匹配的馈线之间形成的匹配短截线; 以及在电介质基板的上侧的馈电线的一侧形成的接地。

公开(公告)号：US08724117B2

公开(公告)日：2014-05-13

申请号：US12779236

申请日：2010-05-13

申请人： Kyong-Hon Kim ,  Seoung-Hun Lee ,  Seung-Hwan Kim ,  El-Hang Lee

发明人： Kyong-Hon Kim ,  Seoung-Hun Lee ,  Seung-Hwan Kim ,  El-Hang Lee

IPC分类号： G01B9/02

CPC分类号： G01N21/636 ,  G01N21/1717 ,  G01N21/21 ,  G01N21/23 ,  G01N21/45 ,  G01N2021/1721

摘要： Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam.

摘要翻译： 测量光学器件和光学材料的电光系数和热光学系数，更具体地说，涉及通过使用干涉条纹测量技术来评估电光和热光学系数的测量系统和方法，其中 可以在不使用复杂的测量设备的情况下在宽的波长上精确地测量这些光学特性。 用于测量电光系数的系统包括：用于输出多波长光束的光源;光干涉仪，包括用于将从光源接收的光束分成两束单独光束的光束分离器;参考臂 用于接收分割光束中的任何一个，用于接收另外的划分的光束并通过连接到光学样本向待测量的光学样本施加电压的采样臂以及用于组合和相互的光束组合器 通过参考臂和样本臂输出的干涉光束，以及用于从光学干涉仪接收相互干涉的光束并分析相互干涉的光束的光谱的光谱分析装置。

公开(公告)号：US20100290055A1

公开(公告)日：2010-11-18

申请号：US12779236

申请日：2010-05-13

申请人： Kyong-Hon Kim ,  Seoung-Hun Lee ,  Seung-Hwan Kim ,  El-Hang Lee

发明人： Kyong-Hon Kim ,  Seoung-Hun Lee ,  Seung-Hwan Kim ,  El-Hang Lee

IPC分类号： G01J3/45

CPC分类号： G01N21/636 ,  G01N21/1717 ,  G01N21/21 ,  G01N21/23 ,  G01N21/45 ,  G01N2021/1721

摘要： Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam.

摘要翻译： 测量光学器件和光学材料的电光系数和热光学系数，更具体地说，涉及通过使用干涉条纹测量技术来评估电光和热光学系数的测量系统和方法，其中 可以在不使用复杂的测量设备的情况下在宽的波长上精确地测量这些光学特性。 用于测量电光系数的系统包括：用于输出多波长光束的光源;光干涉仪，包括用于将从光源接收的光束分成两束单独光束的光束分离器;参考臂 用于接收分割光束中的任何一个，用于接收另外的划分的光束并通过连接到光学样本向待测量的光学样本施加电压的采样臂以及用于组合和相互的光束组合器 通过参考臂和样本臂输出的干涉光束，以及用于从光学干涉仪接收相互干涉的光束并分析相互干涉的光束的光谱的光谱分析装置。