公开(公告)号：US07477110B2

公开(公告)日：2009-01-13

申请号：US10588939

申请日：2005-01-27

申请人： Jose De Jesus Pineda De Gyvez ,  Alexander Guido Gronthoud ,  Cristiano Cenci

发明人： Jose De Jesus Pineda De Gyvez ,  Alexander Guido Gronthoud ,  Cristiano Cenci

IPC分类号： G01R31/02

CPC分类号： H03L7/06 ,  G01R31/2824 ,  G01R31/30 ,  G01R31/3161

摘要： According to an example embodiment, there is a testing device for testing a phase locked loop having a power supply input. The testing device comprises a power supply unit for providing a power supply signal VDD having a variation profile to the power supply input of the phase locked loop, wherein a width and height of said variation profile are formed in such a way, that the voltage controlled oscillator is prevented from outputting an oscillating output signal. There is a means for disabling a feedback signal to a phase comparator of the phase locked loop such that said phase locked loop is operated in an open loop mode, and a meter for measuring a measurement signal of the phase locked loop, while said power supply signal is provided to the power supply input.

摘要翻译： 根据示例实施例，存在用于测试具有电源输入的锁相环的测试装置。 测试装置包括电源单元，用于向锁相环的电源输入端提供具有变化曲线的电源信号VDD，其中以这种方式形成所述变化曲线的宽度和高度， 防止振荡器输出振荡输出信号。 存在用于禁用反相信号到相位锁定环路的相位比较器的装置，使得所述锁相环以开环模式操作，以及用于测量锁相环的测量信号的仪表，同时所述电源 信号被提供给电源输入。

公开(公告)号：US20070132525A1

公开(公告)日：2007-06-14

申请号：US10588939

申请日：2005-01-27

申请人： Jose Pineda de Gyvez ,  Alexander Gronthoud ,  Cristiano Cenci

发明人： Jose Pineda de Gyvez ,  Alexander Gronthoud ,  Cristiano Cenci

IPC分类号： H03L7/099

CPC分类号： H03L7/06 ,  G01R31/2824 ,  G01R31/30 ,  G01R31/3161

摘要： Testing device for testing a phase locked loop having a power supply input, said testing device comprising: a power supply unit for providing a power supply signal VDD having a variation profile to the power supply input of the phase locked loop, wherein a width and height of said variation profile are formed in such a way, that the voltage controlled oscillator is prevented from outputting an oscillating output signal U,,,, ta means for disabling a feedback signal to a phase comparator of the phase locked loop such that said phase locked loop is operated in an open loop mode, and a meter for measuring a measurement signal of the phase locked loop, while said power supply signal is provided to the power supply input.

摘要翻译： 用于测试具有电源输入的锁相环的测试装置，所述测试装置包括：电源单元，用于向所述相的电源输入提供具有变化曲线的电源信号V DD， 锁定回路，其中所述变化曲线的宽度和高度以这样的方式形成，使得压控振荡器被阻止输出振荡输出信号U 1，...， 反馈信号到锁相环的相位比较器，使得所述锁相环以开环模式工作，以及用于测量锁相环的测量信号的仪表，同时所述电源信号被提供给电源 输入。