Silicon test structures for separate measurement of NMOS and PMOS transistor delays

    公开(公告)号:US12044732B2

    公开(公告)日:2024-07-23

    申请号:US17494614

    申请日:2021-10-05

    摘要: Silicon test structures are described that enable separate measurement of n-channel metal-oxide semiconductor (NMOS) and p-channel metal-oxide semiconductor (PMOS) transistor delays. NMOS and PMOS specific non-inverting stages may be used to construct a multi-stage ring oscillator. Each of the non-inverting stages generates either a rising or falling primary transition that is determined by either NMOS or PMOS transistors, respectively. The opposing transition for a particular non-inverting stage is triggered by propagation of the primary transition to a subsequent non-inverting stage (producing a “reset” pulse). A frequency of the ring oscillator is determined by the primary transition and one transistor type (NMOS or PMOS). Specifically, the frequency is determined by the propagation delay of the primary transition through the entire ring oscillator.

    Decoupling BTI and HCI mechanism in ring oscillator

    公开(公告)号:US11789064B1

    公开(公告)日:2023-10-17

    申请号:US17852181

    申请日:2022-06-28

    摘要: A ring oscillator circuit design includes three or more inverter stages connected in series. Each inverter stage includes one or more inverter devices including a PMOS device and a coupled NMOS device. The PMOS device in each of odd alternating inverter devices of the three or more inverter stages having a source terminal receiving power from a power rail conductor, and a source terminal of the coupled NMOS device in each of first alternating inverter devices is grounded. An output of a last inverter device of a last stage of the three or more inverter stages is connected to an input of a first inverter stage. The method measures a first frequency of a first ring oscillator circuit and measures a second frequency of a second ring oscillator circuit design to determine either a BTI or HCI failure mechanism of the first ring oscillator circuit based on the measurements.

    Systems and methods for monitoring sensors
    3.
    发明授权
    Systems and methods for monitoring sensors 有权
    用于监控传感器的系统和方法

    公开(公告)号:US09389260B2

    公开(公告)日:2016-07-12

    申请号:US13630939

    申请日:2012-09-28

    CPC分类号: G01R27/28 G01R31/2824

    摘要: An impedance analyzer is provided. The analyzer includes a signal excitation generator comprising a digital to analog converter, where a transfer function of the digital to analog converter from digital to analog is programmable. The impedance analyzer further includes a receiver comprising a low noise amplifier (LNA) and an analog to digital converter (ADC), where the LNA is a current to voltage converter; where the programmable digital to analog transfer function is implemented by a direct digital synthesizer (DDS) and a voltage mode digital to analog converter, or a digital phase locked loop (PLL), or both. Further, a multivariable sensor node having an impedance analyzer is provided. Furthermore, a multivariable sensor network having a plurality of multivariable sensor nodes is provided.

    摘要翻译: 提供阻抗分析仪。 该分析器包括一个包括数模转换器的信号激励发生器,其中从数字到模拟的数模转换器的传递函数是可编程的。 该阻抗分析器还包括一个包括低噪声放大器(LNA)和模数转换器(ADC)的接收器,其中LNA是电流到电压转换器; 其中可编程数字到模拟传递功能由直接数字合成器(DDS)和电压模式数模转换器或数字锁相环(PLL)或两者实现。 此外,提供了具有阻抗分析器的多变量传感器节点。 此外,提供了具有多个多变量传感器节点的多变量传感器网络。

    Crystal oscillator monitoring circuit
    5.
    发明授权
    Crystal oscillator monitoring circuit 有权
    晶体振荡器监控电路

    公开(公告)号:US09234936B1

    公开(公告)日:2016-01-12

    申请号:US14451404

    申请日:2014-08-04

    IPC分类号: G01R31/28 H03B5/32

    摘要: In an integrated circuit, a clock monitor circuit detects when an analog clock signal output by an on-chip crystal oscillator has stabilized. The clock monitor circuit uses an envelope follower circuit to monitor the envelope of the analog clock signal and compare the amplitude of the envelope with a predetermined amplitude value. When the predetermined value is reached and the envelope has remained steady for a predetermined time, an oscillator okay signal is generated. If an oscillator okay signal is not detected within another predetermined time, then an oscillator failure signal may be generated.

    摘要翻译: 在集成电路中,时钟监视电路检测由片上晶体振荡器输出的模拟时钟信号何时稳定。 时钟监视电路使用包围跟踪器电路来监视模拟时钟信号的包络,并将包络的幅度与预定的振幅值进行比较。 当达到预定值并且信封在预定时间内保持稳定时,产生振荡器良好信号。 如果在另一预定时间内没有检测到振荡器正常信号,则可能产生振荡器故障信号。

    RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR
    6.
    发明申请
    RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR 有权
    环形振荡器测试与电力传感电阻

    公开(公告)号:US20140097858A1

    公开(公告)日:2014-04-10

    申请号:US13647719

    申请日:2012-10-09

    IPC分类号: G01R31/00

    CPC分类号: G01R31/2824 H03K3/0315

    摘要: A test circuit for a ring oscillator comprising a plurality of inverting stages includes a power supply, the power supply configured to provide a voltage to the plurality of inverting stages of the ring oscillator at a power output; and a power sensing resistor located between the power output of the power supply and direct current (DC) bias inputs of the inverting stages of the ring oscillator, wherein a signal from the power sensing resistor is configured to be monitored to determine a characteristic of the ring oscillator.

    摘要翻译: 包括多个反相级的环形振荡器的测试电路包括电源,所述电源被配置为在功率输出时向所述环形振荡器的所述多个反相级提供电压; 以及位于电源的功率输出和环形振荡器的反相级的直流(DC)偏置输入之间的功率感测电阻器,其中来自功率感测电阻器的信号被配置为被监视以确定 环形振荡器。

    Measuring bias temperature instability induced ring oscillator frequency degradation
    7.
    发明授权
    Measuring bias temperature instability induced ring oscillator frequency degradation 失效
    测量偏置温度不稳定引起的环形振荡器频率降低

    公开(公告)号:US08587383B2

    公开(公告)日:2013-11-19

    申请号:US13313416

    申请日:2011-12-07

    CPC分类号: G01R31/2824 H03K3/0315

    摘要: A method establishes an initial voltage in a ring oscillator and a logic circuit of an integrated circuit device. Following this, the method enables the operating state of the ring oscillator. After enabling the operating state of the ring oscillator, the method steps up to a stressing voltage in the ring oscillator. The initial voltage is approximately one-half the stressing voltage. The stressing voltage creates operating-level stress within the ring oscillator. The method measures the operating-level frequency within the ring oscillator using an oscilloscope (after stepping up to the stressing voltage).

    摘要翻译: 一种方法在环形振荡器和集成电路器件的逻辑电路中建立初始电压。 此后,该方法启用环形振荡器的工作状态。 在启用环形振荡器的工作状态之后,该方法在环形振荡器中达到应力电压。 初始电压约为应力电压的一半。 应力电压在环形振荡器内产生工作电平应力。 该方法使用示波器测量环形振荡器内的工作电平频率(升压到应力电压之后)。

    Method for measuring transconductance
    8.
    发明授权
    Method for measuring transconductance 失效
    测量跨导的方法

    公开(公告)号:US08242769B2

    公开(公告)日:2012-08-14

    申请号:US12640409

    申请日:2009-12-17

    IPC分类号: G01R19/18 G01R31/08

    CPC分类号: G01R31/2824

    摘要: A method for measuring transconductance of an oscillating circuit is provided. The oscillating circuit includes an inverter. When an input terminal and an output terminal of the inverter are floated, the bias voltage of the inverter is obtained by measuring the output terminal thereof. Based on floating the input terminal and respectively providing a first voltage and a second voltage to the output terminal, a first current corresponding to the first voltage and a second current corresponding to the second voltage are measured from the output terminal. The first voltage and the bias voltage have the same voltage levels. An output resistor value of the inverter is obtained according to the first and second voltages and the first and second currents. The transconductance of the oscillating circuit is obtained according to the output resistor value.

    摘要翻译: 提供了一种用于测量振荡电路的跨导的方法。 振荡电路包括逆变器。 当变频器的输入端子和输出端子浮起时,通过测量其输出端子来获得逆变器的偏置电压。 基于浮置输入端子并且向输出端子分别提供第一电压和第二电压,从输出端子测量对应于第一电压的第一电流和对应于第二电压的第二电流。 第一电压和偏置电压具有相同的电压电平。 根据第一和第二电压以及第一和第二电流获得反相器的输出电阻值。 根据输出电阻值得到振荡电路的跨导。

    Methods and Systems for Production Testing of DCO Capacitors
    9.
    发明申请
    Methods and Systems for Production Testing of DCO Capacitors 失效
    DCO电容器生产测试方法与系统

    公开(公告)号:US20120112768A1

    公开(公告)日:2012-05-10

    申请号:US13111295

    申请日:2011-05-19

    申请人: Jeroen KUENEN

    发明人: Jeroen KUENEN

    IPC分类号: G01R27/32

    摘要: Systems provide for a test system for capacitors in a digitally controllable oscillator (DCO). The system includes: capacitor toggling logic configured to switch on and off a selected one of the capacitors at a modulation frequency; a tone generator configured to generate a tone; a mixer configured to receive the tone and an output carrier signal from the DCO while the capacitor toggling logic is switching the selected one of the capacitors on and off and to output an intermediate frequency signal having FM sidebands based on the modulation frequency and relative capacitor size; and an evaluation circuit configured to evaluate a frequency deviation associated with the selected one of the capacitors based on at least one of the FM sidebands.

    摘要翻译: 系统为数字可控振荡器(DCO)中的电容器提供测试系统。 该系统包括:电容器切换逻辑,被配置为以调制频率接通和关断所选择的一个电容器; 音调发生器,被配置为产生音调; 配置为在电容器切换逻辑正在切换所选择的一个电容器的同时接收来自DCO的音调和输出载波信号的混频器,并且基于调制频率和相对电容器大小来输出具有FM边带的中频信号 ; 以及评估电路,被配置为基于所述FM边带中的至少一个来评估与所选择的所述一个所述电容器相关联的频率偏差。

    Jitter detection circuit and jitter detection method
    10.
    发明授权
    Jitter detection circuit and jitter detection method 失效
    抖动检测电路和抖动检测方法

    公开(公告)号:US08040995B2

    公开(公告)日:2011-10-18

    申请号:US12078289

    申请日:2008-03-28

    IPC分类号: H03D3/24 H04L7/00

    摘要: A jitter detection circuit includes an oscillation circuit, a measurement period setting circuit for outputting a measurement period signal based on a measurement period specifying signal, the measurement period setting circuit receiving the output clock from a PLL circuit, a counter for counting the number of clock cycles output from the oscillation circuit over the period during which the measurement period signal is being output, a reference count value determining circuit for setting a reference count value for the number of clock cycles output from the oscillation circuit over the period during which the measurement period signal is being output, and an error detection circuit for detecting the jitter error of the PLL circuit based on the maximum count value and minimum count value counted by the counter, and the reference count value.

    摘要翻译: 抖动检测电路包括振荡电路,测量周期设定电路,用于根据测量周期指定信号输出测量周期信号,测量周期设置电路从PLL电路接收输出时钟;计数器,用于计数时钟数 在输出测量周期信号的期间从振荡电路输出的周期;基准计数值判定电路,用于在测量周期期间设定从振荡电路输出的时钟周期数的基准计数值 信号被输出,以及检错电路,用于根据由计数器计数的最大计数值和最小计数值以及基准计数值检测PLL电路的抖动误差。