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1.发明授权公开(公告)号：US07765445B2
公开(公告)日：2010-07-27
申请号：US12032649
申请日：2008-02-16
IPC分类号： G01R31/28
CPC分类号： G01R31/318502 , G01R31/2824 , G01R31/2884 , G01R31/31727
摘要： System-accessible frequency measuring circuits and procedures permit on-chip testing of the oscillators and provide test results observable off chip via LSSD scan paths. This allows a rapid ensemble of ring oscillators in a standard ASIC test flow without the need for on chip analog test equipment (the test apparatus has effectively been created on device and can be digitally configured, operated and read). Frequency measuring logic that can 1) functionally operate to measure the frequency of the ring oscillators; 2) participate in traditional logical tests such as LSSD and LBIST to verify that the circuit is manufactured correctly and is likely to operate and 3) operate in a special ring-oscillator test mode, that allows the logic to operate on a tester very similarly to the way it does functionally. In this mode, the frequency measuring logic can be scanned to a specific state, started by pulsing a digital I/O, and the measured analog value can be scanned out sometime later after the test has completed. Test interrogations are distributed on-chip through an LSSD shift register chain to individually evaluate each of a plurality of the oscillators.
摘要翻译： 系统可访问的频率测量电路和程序允许对振荡器进行片上测试，并通过LSSD扫描路径提供可观察到的芯片外的测试结果。 这允许在标准ASIC测试流程中快速地组合环形振荡器，而不需要片上模拟测试设备（测试设备已经在设备上有效地创建并且可以被数字地配置，操作和读取）。 频率测量逻辑，可以1）功能操作来测量环形振荡器的频率; 2）参与传统的逻辑测试，如LSSD和LBIST，以验证电路是否正确制造，并且可能运行，以及3）以特殊的环形振荡器测试模式工作，允许逻辑在测试仪上工作，非常类似于 它在功能上的方式。 在这种模式下，频率测量逻辑可以被扫描到一个特定的状态，通过脉冲数字I / O开始，测量的模拟值可以在测试完成后的某个时间被扫描出来。 测试询问通过LSSD移位寄存器链在芯片上分布，以分别评估多个振荡器中的每一个。
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2.发明申请公开(公告)号：US20090210760A1
公开(公告)日：2009-08-20
申请号：US12032649
申请日：2008-02-16
IPC分类号： G01R31/3181
CPC分类号： G01R31/318502 , G01R31/2824 , G01R31/2884 , G01R31/31727
摘要： System-accessible frequency measuring circuits and procedures permit on-chip testing of the oscillators and provide test results observable off chip via LSSD scan paths. This allows a rapid ensemble of ring oscillators in a standard ASIC test flow without the need for on chip analog test equipment (the test apparatus has effectively been created on device and can be digitally configured, operated and read). Frequency measuring logic that can 1) functionally operate to measure the frequency of the ring oscillators; 2) participate in traditional logical tests such as LSSD and LBIST to verify that the circuit is manufactured correctly and is likely to operate and 3) operate in a special ring-oscillator test mode, that allows the logic to operate on a tester very similarly to the way it does functionally. In this mode, the frequency measuring logic can be scanned to a specific state, started by pulsing a digital I/O, and the measured analog value can be scanned out sometime later after the test has completed. Test interrogations are distributed on-chip through an LSSD shift register chain to individually evaluate each of a plurality of the oscillators.
摘要翻译： 系统可访问的频率测量电路和程序允许对振荡器进行片上测试，并通过LSSD扫描路径提供可观察到的芯片外的测试结果。 这允许在标准ASIC测试流程中快速地组合环形振荡器，而不需要片上模拟测试设备（测试设备已经在设备上有效地创建并且可以被数字地配置，操作和读取）。 频率测量逻辑，可以1）功能操作来测量环形振荡器的频率; 2）参与传统的逻辑测试，如LSSD和LBIST，以验证电路是否正确制造，并且可能运行，以及3）以特殊的环形振荡器测试模式工作，这允许逻辑在测试仪上工作，非常类似于 它在功能上的方式。 在这种模式下，频率测量逻辑可以被扫描到一个特定的状态，通过脉冲数字I / O开始，测量的模拟值可以在测试完成后的某个时间被扫描出来。 测试询问通过LSSD移位寄存器链在芯片上分布，以分别评估多个振荡器中的每一个。
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